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Title: Structuring by field enhancement of glass, Ag, Au, and Co thin films using short pulse laser ablation

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3264833· OSTI ID:21359389
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  1. Department of Laser, National Institute for Laser, Plasma and Radiation Physics, Atomistilor 409, 077125 Magurele (Romania)

Single pulse laser ablation of glass, Ag, Au, and Co thin films was experimentally investigated with a laser pulse width of 400 ps at a wavelength of 532 nm both in the far and near fields. In the far-field regime, the electromagnetic field results from a focused laser beam, while the near-field regime is realized by a combination of the focused laser beam incident on a spherical colloidal particle. For the near-field experiments we have used polystyrene colloidal particles of 700 nm diameter self-assembled or spin coated on top of the surfaces. Laser fluences applied are in the range of 0.01-10 J/cm{sup 2}. The diameter and the morphologies of the ablated holes were investigated by optical microscopy, profilometry, scanning electron microscopy, and atomic force microscopy. The dependence of the shape of the holes reflects the fluence regime and the thermophysical properties, i.e., melting temperature and thermal diffusivity of the surfaces involved in the experiments. We give quantitative data about the fluence threshold, diameter, and depth ablation dependence for the far and near fields and discuss their values with respect to the enhancement factor of the intensity of the electromagnetic field due to the use of the colloidal particles. Theoretical estimations of the intensity enhancement were done using the finite-difference time-domain method by using the RSOFT software. The application of near fields allows structuring of the surfaces with structure dimension in the order of 100 nm and even below.

OSTI ID:
21359389
Journal Information:
Journal of Applied Physics, Vol. 106, Issue 11; Other Information: DOI: 10.1063/1.3264833; (c) 2009 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English