skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Tuning of electrical charging effects for ferromagnetic Mn-doped ZnO nanocrystals embedded into a SiO{sub 2} layer fabricated by KrF excimer laser irradiation

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3176933· OSTI ID:21359326
; ;  [1];  [2]
  1. Quantum-functional Semiconductor Research Center, Dongguk University, Seoul 100-715 (Korea, Republic of)
  2. School of Advanced Materials Science and Engineering, Sungkyunkwan University, Gyeong-Gi 440-746 (Korea, Republic of)

The ZnMnO nanocrystals were formed by the laser irradiation of the sputter-deposited ZnMnO ultrathin layer using a 248 nm KrF excimer laser, and the size and density of the nanocrystals were observed to be controllable by modulations of either the energy density or the frequency of the irradiated pulsed-laser beam. Metal-oxide-semiconductor capacitors fabricated using ZnMnO nanocrystals clearly showed the electrical charging effect, and it was observed that the memory window depends on the size and density of nanocrystals. For measurements of the spontaneous magnetization, ZnMnO nanocrystals showed to have room-temperature ferromagnetism with M{sub r} of approx1.5 emu/cm{sup 3} and H{sub c} 167 Oe. By using ferromagnetism in ZnMnO nanocrystals, tuning of the memory window was demonstrated. Namely, it was clearly observed that the flat-band voltage shift of approx1.25 V can be modulated to be approx0.8 V by applying the magnetic field. This is attributed to the modulation of probabilities for tunneling events due to the increased magnetoelectrical repulsion between spin-polarized carriers in ZnMnO dilute magnetic semiconductor nanocrystals and unpolarized carriers in p-Si under the magnetic field. These results suggest that ZnMnO nanocrystals can be used for spin-functional memory devices.

OSTI ID:
21359326
Journal Information:
Journal of Applied Physics, Vol. 106, Issue 2; Other Information: DOI: 10.1063/1.3176933; (c) 2009 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English