Characterization of polycrystals with elongated duplex microstructure by inversion of ultrasonic backscattering data
- Department of Materials Science and Engineering, Edison Joining Technology Center, Ohio State University, 1248 Arthur E. Adams Dr., Columbus, Ohio 43221 (United States)
In this letter a simple analytical ultrasonic backscattering model is proposed for determination of characteristic microstructural scales in polycrystalline materials with elongated grains. The inversion methodology for microstructural parameters is based on backscattering coefficient ratios measured in different propagation directions. The ultrasonic backscattering measurements were performed on a Ti alloy sample with a duplex microstructure and the model was applied to experimental data inversion to size the material microtexture.
- OSTI ID:
- 21347411
- Journal Information:
- Applied Physics Letters, Vol. 96, Issue 16; Other Information: DOI: 10.1063/1.3416910; (c) 2010 American Institute of Physics; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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