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Title: Simple Validation of Transient Plume Models Using Molecular Beam-Related Applications

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3076539· OSTI ID:21254960
 [1]
  1. Stinger Ghaffarian Technologies, Inc., 7701 Greenbelt Rd., Greenbelt, Maryland 20770 (United States)

A simple effort using molecular beam data to compare the results of two different transient free molecule point source models was performed, motivated by a desire to determine the utility of such formulations for a variety of time-dependent applications. These models are evaluated against effusive molecular beam time-of-flight data, as well as behavior observed in pulsed laser ablation experiments and high-fidelity direct simulation Monte Carlo results. Such comparisons indicate that the physical behavior of these time-dependent expansions require taking a surface-enforced directional bias into account. This bias has been absent in a number of investigative formulations, both historical and current.

OSTI ID:
21254960
Journal Information:
AIP Conference Proceedings, Vol. 1084, Issue 1; Conference: 26. international symposium on rarified gas dynamics, Kyoto (Japan), 20-25 Jul 2008; Other Information: DOI: 10.1063/1.3076539; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English