Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances
- Strutt. Dip. di Matematica e Fisica, Universita di Sassari, Italy and INFN, Sez. di Cagliari (Italy)
- Dipartimento di Fisica, Universita di Pisa, Italy and INFN, Sez. di Pisa (Italy)
Phase contrast imaging is a technique widely used in synchrotron facilities for nondestructive analysis. Such technique can also be implemented through microfocus x-ray tube systems. Recently, a relatively new type of compact, quasimonochromatic x-ray sources based on Compton backscattering has been proposed for phase contrast imaging applications. In order to plan a phase contrast imaging system setup, to evaluate the system performance and to choose the experimental parameters that optimize the image quality, it is important to have reliable software for phase contrast imaging simulation. Several software tools have been developed and tested against experimental measurements at synchrotron facilities devoted to phase contrast imaging. However, many approximations that are valid in such conditions (e.g., large source-object distance, small transverse size of the object, plane wave approximation, monochromatic beam, and Gaussian-shaped source focal spot) are not generally suitable for x-ray tubes and other compact systems. In this work we describe a general method for the simulation of phase contrast imaging using polychromatic sources based on a spherical wave description of the beam and on a double-Gaussian model of the source focal spot, we discuss the validity of some possible approximations, and we test the simulations against experimental measurements using a microfocus x-ray tube on three types of polymers (nylon, poly-ethylene-terephthalate, and poly-methyl-methacrylate) at varying source-object distance. It will be shown that, as long as all experimental conditions are described accurately in the simulations, the described method yields results that are in good agreement with experimental measurements.
- OSTI ID:
- 21185884
- Journal Information:
- Journal of Applied Physics, Vol. 104, Issue 9; Other Information: DOI: 10.1063/1.3006130; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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