Charge trapping induced by plasma in alumina electrode surface investigated by thermoluminescence and optically stimulated luminescence

Journal Article · Mon Feb 02 00:00:00 EST 2009 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3076122· OSTI ID:21175941

Ambrico, P F ^[1]; Ambrico, M ^[1]; Schiavulli, L ^[2]; Ligonzo, T; Augelli, V ^[2]

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1. CNR-IMIP Sezione di Bari, Via Orabona, 4 I-70126 Bari (Italy)
2. CNISM Unita di Ricerca Bari Universita, Universita degli Studi di Bari, Via Amendola, 173 I-70126-Bari (Italy)

The plasma of a dielectric barrier discharge can fill traps in the alumina that cover the electrode. Trap energies and lifetimes are estimated by thermoluminescence and optically stimulated luminescence. Comparison with similar results for traps created by other radiation sources clarifies the mechanisms regulating this effect. Alumina's trap energies are approximately 1 eV, and the traps remain active for several days after plasma exposure. These results could be important to keep dielectric barrier discharge plasmas uniform since a trapped charge can be an electron reservoir.

• OSTI ID: 21175941
• Journal Information: Applied Physics Letters, Vol. 94, Issue 5; Other Information: DOI: 10.1063/1.3076122; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ALUMINIUM OXIDES
DIELECTRIC MATERIALS
ELECTRIC DISCHARGES
ELECTRODES
ELECTRONS
PHOTOLUMINESCENCE
PLASMA
PLASMA DIAGNOSTICS
RADIATION SOURCES
THERMOLUMINESCENCE
TRAPPING