Analyzer-based phase contrast imaging and phase retrieval using a rotating anode x-ray source

Journal Article · Mon Dec 17 00:00:00 EST 2007 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2825426· OSTI ID:21016234

Vine, D J; Paganin, D M; Pavlov, K M; Kraeusslich, J; Wehrhan, O; Uschmann, I; Foerster, E ^[1]

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1. School of Physics, Monash University, Victoria 3800 (Australia)

We have performed an analyzer crystal based phase contrast imaging (ABI) experiment using a rotating anode x-ray source. The use of such an incoherent source demonstrates the potential of ABI as a quantitative characterization tool for the laboratory environment. A phase contrast image of a plastic phantom was recorded on high resolution x-ray film and the projected thickness was retrieved from a single image. The projected thickness recovered from the phase contrast image was shown to quantitatively agree with a reference optical microscope measurement.

• OSTI ID: 21016234
• Journal Information: Applied Physics Letters, Vol. 91, Issue 25; Other Information: DOI: 10.1063/1.2825426; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ANODES
CRYSTALS
FILMS
IMAGE PROCESSING
IMAGES
OPTICAL MICROSCOPES
OPTICS
PHANTOMS
THICKNESS
X RADIATION
X-RAY SOURCES