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Title: Effect of boron on the microstructure of near-eutectic Al-Si alloys

Abstract

The effect of boron on the microstructure of a near-eutectic Al-Si alloy (ZL109) was investigated by scanning electron microscopy (SEM) and electron beam microprobe analysis (EPMA). It was found that {alpha}-Al dendrites and eutectic clusters were significantly refined by the addition of boron. Another interesting discovery is that the near-eutectic alloy exhibited hypereutectic structure characteristics when the level of boron added exceeds 0.3%, i.e., primary Si is precipitated in the eutectic microstructure. A new type of nucleation substrate for the primary Si is found, Al {sub x}Ca {sub m}B {sub n}Si. This appears to be the main reason for the precipitation of primary Si.

Authors:
 [1];  [1];  [1]
  1. Key Laboratory of Materials Liquid Structure and Heredity, Ministry of Education, Shandong University, Jinan 250061, Shandong (China)
Publication Date:
OSTI Identifier:
21003533
Resource Type:
Journal Article
Journal Name:
Materials Characterization
Additional Journal Information:
Journal Volume: 58; Journal Issue: 2; Other Information: DOI: 10.1016/j.matchar.2006.04.009; PII: S1044-5803(06)00107-0; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1044-5803
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM ALLOYS; BORON; DENDRITES; ELECTRON BEAMS; ELECTRON MICROPROBE ANALYSIS; EUTECTICS; MICROSTRUCTURE; NUCLEATION; PRECIPITATION; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON ALLOYS; SUBSTRATES

Citation Formats

Yuying, Wu, Xiangfa, Liu, and Xiufang, Bian. Effect of boron on the microstructure of near-eutectic Al-Si alloys. United States: N. p., 2007. Web. doi:10.1016/j.matchar.2006.04.009.
Yuying, Wu, Xiangfa, Liu, & Xiufang, Bian. Effect of boron on the microstructure of near-eutectic Al-Si alloys. United States. https://doi.org/10.1016/j.matchar.2006.04.009
Yuying, Wu, Xiangfa, Liu, and Xiufang, Bian. 2007. "Effect of boron on the microstructure of near-eutectic Al-Si alloys". United States. https://doi.org/10.1016/j.matchar.2006.04.009.
@article{osti_21003533,
title = {Effect of boron on the microstructure of near-eutectic Al-Si alloys},
author = {Yuying, Wu and Xiangfa, Liu and Xiufang, Bian},
abstractNote = {The effect of boron on the microstructure of a near-eutectic Al-Si alloy (ZL109) was investigated by scanning electron microscopy (SEM) and electron beam microprobe analysis (EPMA). It was found that {alpha}-Al dendrites and eutectic clusters were significantly refined by the addition of boron. Another interesting discovery is that the near-eutectic alloy exhibited hypereutectic structure characteristics when the level of boron added exceeds 0.3%, i.e., primary Si is precipitated in the eutectic microstructure. A new type of nucleation substrate for the primary Si is found, Al {sub x}Ca {sub m}B {sub n}Si. This appears to be the main reason for the precipitation of primary Si.},
doi = {10.1016/j.matchar.2006.04.009},
url = {https://www.osti.gov/biblio/21003533}, journal = {Materials Characterization},
issn = {1044-5803},
number = 2,
volume = 58,
place = {United States},
year = {Thu Feb 15 00:00:00 EST 2007},
month = {Thu Feb 15 00:00:00 EST 2007}
}