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Title: Synchronizing fast electrically driven phenomena with synchrotron x-ray probes

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.2668989· OSTI ID:20953251
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  1. Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)

Time scales of long-range physical processes in solids are typically in the range of picoseconds to nanoseconds. These times are commensurate with the time resolution of structural probes based on modern synchrotron x-ray sources. Several processes of technological and scientific interest can be driven by applied electric fields, but synchronizing electrically driven phenomena with an x-ray probe poses a technical challenge. We describe the synchronization of a well-defined number of fast electrical pulses with the time structure of synchrotron x rays to probe the dynamics of thin films and nanostructures. This synchronization technique yields x-ray transient signals with 600 ps transitions in ferroelectric thin films, with a contribution of approximately 320 ps due to timing jitter in the synchronization.

OSTI ID:
20953251
Journal Information:
Review of Scientific Instruments, Vol. 78, Issue 2; Other Information: DOI: 10.1063/1.2668989; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English