Crystal cavity resonance for hard x rays: A diffraction experiment

Journal Article · Sun Oct 01 00:00:00 EDT 2006 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PHYSREVB.74.134111· OSTI ID:20853736

Chang, S -L ^[1]; Stetsko, Yu P; Tang, M -T; Shew, B -Y ^[2]; Lee, Y -R; Sun, W -H; Wu, H -H; Kuo, T -T; Chen, S -Y; Chang, Y -Y; Shy, J -T ^[1]; Yabashi, M ^[3]; Ishikawa, T ^[3]; Lin, Y -H ^[4]; Tamasaku, K; Miwa, D ^[5]

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1. Department of Physics, National Tsing Hua University (NTHU), Hsinchu, Taiwan, 300 (China)
2. National Synchrotron Radiation Research Center (NSRRC), Hsinchu, Taiwan, 300 (China)
3. Spring-8/JASRI, Mikazuki, Hyogo 679-5198 (Japan)
4. Scientific Instrumentation Research and Development Center, Hsinchu, Taiwan, 300 (China)
5. Spring-8/RIKEN, Mikazuki, Hyogo 679-5148 (Japan)

We report the details of the recent x-ray back diffraction experiments, in which interference fringes due to x-ray cavity resonance are unambiguously observed. The Fabry-Perot type cavities, the tested crystal devices of reflectivity R{approx_equal}0.5 and finesse F{approx_equal}2.3, consist of monolithic two-plate and eight-plate silicon crystals. They were prepared by using x-ray lithographic techniques. The thicknesses of the crystal plates and the gaps between the two adjacent plates are a few tens to hundreds {mu}m. The (12 4 0) back reflection and synchrotron x-radiation of energy resolution {delta}E=0.36 meV at 14.4388 keV are employed. Interference fringes in angle- and photon-energy scans for two-plate and eight-plate cavities are shown. Considerations on the temporal and spatial coherence for observable resonance interference fringes using synchrotron x-rays are presented. The details about the accompanied simultaneous 24-beam diffraction in relation to x-ray photon energy are also described.

• OSTI ID: 20853736
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Vol. 74, Issue 13; Other Information: DOI: 10.1103/PhysRevB.74.134111; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CAVITY RESONATORS
CRYSTALS
ENERGY RESOLUTION
HARD X RADIATION
INTERFERENCE
KEV RANGE
PHOTONS
PLATES
REFLECTION
REFLECTIVITY
RESONANCE
SEMICONDUCTOR MATERIALS
SILICON
THICKNESS
X-RAY DIFFRACTION