Silica-supported silver nanoparticles: Tailoring of structure-property relationships

Journal Article · Tue Mar 01 00:00:00 EST 2005 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1856213· OSTI ID:20668230

Barreca, Davide; Gasparotto, Alberto; Maragno, Cinzia; Tondello, Eugenio; Gialanella, Stefano ^[1]

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1. Instituto di Scienze e Tecnologie Molecolari-Consiglio Nazionale delle Richerche (ISTM-CNR) and Consorzio Interuniversitario Nazionale per la Scienza e Tecnologia dei Materiali (INSTM), Department of Chemical Sciences, Padova University, Via Marzolo, 1-35131 Padova (Italy)

Silica-supported silver nanoparticles were obtained by rf sputtering from Ar plasmas under soft synthesis conditions, with particular attention to the combined influence of rf power and total pressure on the system composition, nanostructure, morphology, and optical properties. In order to attain a thorough insight into the nucleation and growth phenomena of Ag nanoparticles on the silica substrate, several in situ and ex situ characterization techniques were used. In particular, a laser reflection interferometry system was employed for a real-time monitoring of the deposition process, providing useful and complementary information with respect to the other ex situ techniques (x-ray photoelectron spectroscopy and x-ray excited Auger electron spectroscopy, glancing incidence x-ray diffraction, atomic force microscopy, optical-absorption spectroscopy, and transmission electron microscopy). The above investigations evidenced the formation of silver-based nanosystems (average crystallite size {<=}10 nm), whose features (metal content, Ag particle size and shape, structure and optical properties) could be carefully tailored by moderate and controlled variations of the synthesis parameters.

• OSTI ID: 20668230
• Journal Information: Journal of Applied Physics, Vol. 97, Issue 5; Other Information: DOI: 10.1063/1.1856213; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
ATOMIC FORCE MICROSCOPY
AUGER ELECTRON SPECTROSCOPY
CRYSTAL GROWTH
DEPOSITION
INTERFEROMETRY
MORPHOLOGY
NANOSTRUCTURES
NUCLEATION
OPTICAL PROPERTIES
PARTICLE SIZE
PARTICLES
SILICA
SILVER
SPUTTERING
TRANSMISSION ELECTRON MICROSCOPY
ULTRAVIOLET SPECTRA
VISIBLE SPECTRA
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY