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Title: Correlation between bonding structure and microstructure in fullerenelike carbon nitride thin films

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics
; ;  [1];  [2]; ;  [3];  [4]
  1. Institute of Ion Beam Physics and Materials Research, Forschungszentrum Rossendorf, PF-510119, 01314 Dresden (Germany)
  2. Instituto de Ciencia y Tecnologia de Polimeros, Consejo Superior de Investigaciones Cientificas, 28006 Madrid (Spain)
  3. Thin Film Physics Division, Department of Physics, IFM, Linkoeping University, S-58183 Linkoeping (Sweden)
  4. Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Cientificas, 28049 Cantoblanco, Madrid (Spain)

The bonding structure of highly ordered fullerenelike (FL) carbon nitride (CN{sub x}) thin films has been assessed by x-ray absorption near-edge spectroscopy (XANES). Samples with different degrees of FL character have been analyzed to discern spectral signatures related to the FL microstructure. The XANES spectra of FL-CN{sub x} films resemble that of graphitic CN{sub x}, evidencing the sp{sup 2} hybridization of both C and N atoms. The FL structure is achieved with the promotion of N in threefold positions over pyridinelike and cyanidelike bonding environments. In addition, the relative {pi}{sup *}/{sigma}* XANES intensity ratio at the C(1s) edge is independent of the FL character, while it decreases {approx}40% at the N(1s) edge with the formation of FL arrangements. This result indicates that there is no appreciable introduction of C-sp{sup 3} hybrids with the development of FL structures and, additionally, that a different spatial localization of {pi} electrons at C and N sites takes place in curved graphitic structures. The latter has implications for the elastic properties of graphene sheets and could, as such, explain the outstanding elastic properties of FL-CN{sub x}.

OSTI ID:
20666274
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Vol. 71, Issue 12; Other Information: DOI: 10.1103/PhysRevB.71.125414; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
Country of Publication:
United States
Language:
English