Correlation between bonding structure and microstructure in fullerenelike carbon nitride thin films
- Institute of Ion Beam Physics and Materials Research, Forschungszentrum Rossendorf, PF-510119, 01314 Dresden (Germany)
- Instituto de Ciencia y Tecnologia de Polimeros, Consejo Superior de Investigaciones Cientificas, 28006 Madrid (Spain)
- Thin Film Physics Division, Department of Physics, IFM, Linkoeping University, S-58183 Linkoeping (Sweden)
- Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Cientificas, 28049 Cantoblanco, Madrid (Spain)
The bonding structure of highly ordered fullerenelike (FL) carbon nitride (CN{sub x}) thin films has been assessed by x-ray absorption near-edge spectroscopy (XANES). Samples with different degrees of FL character have been analyzed to discern spectral signatures related to the FL microstructure. The XANES spectra of FL-CN{sub x} films resemble that of graphitic CN{sub x}, evidencing the sp{sup 2} hybridization of both C and N atoms. The FL structure is achieved with the promotion of N in threefold positions over pyridinelike and cyanidelike bonding environments. In addition, the relative {pi}{sup *}/{sigma}* XANES intensity ratio at the C(1s) edge is independent of the FL character, while it decreases {approx}40% at the N(1s) edge with the formation of FL arrangements. This result indicates that there is no appreciable introduction of C-sp{sup 3} hybrids with the development of FL structures and, additionally, that a different spatial localization of {pi} electrons at C and N sites takes place in curved graphitic structures. The latter has implications for the elastic properties of graphene sheets and could, as such, explain the outstanding elastic properties of FL-CN{sub x}.
- OSTI ID:
- 20666274
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 71, Issue 12; Other Information: DOI: 10.1103/PhysRevB.71.125414; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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