X-ray Fraunhofer diffraction patterns from a thin-film waveguide

Journal Article · Mon Dec 11 00:00:00 EST 1995 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.115346· OSTI ID:151388

Feng, Y P; Sinha, S K; Fullerton, E E ^[1]; Gruebel, G; Abernathy, D ^[2]; Siddons, D P; Hastings, J B ^[3]

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1. Argonne National Laboratory, Argonne, Illnois 60439 (United States)
2. European Synchrotron Radiation Facility, Grenoble (France)
3. Brookhaven National Laboratory, Upton, New York 11973 (United States)

We have observed the Fraunhofer diffraction pattern of x-rays exiting from the end face of a SiO{sub 2}/polyimide/Si thin-film waveguide. The measured angular intensity distributions are in excellent agreement with those calculated based on the dimensions and the refractive index profile of the guide. Our measurement confirms that, at the end face of the guide, the wavefront of a single guided mode is fully coherent in the direction normal to the guiding plane. This focused and transversely coherent x-ray beam may be used as a source for coherence-based experiments, such as x-ray photon correlation spectroscopy. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 151388
• Journal Information: Applied Physics Letters, Vol. 67, Issue 24; Other Information: PBD: 11 Dec 1995
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
66 PHYSICS
X RADIATION
FOCUSING
DIFFRACTION
FRAUNHOFER LINES
POLYMERS
SILICON
SILICON OXIDES
SYNCHROTRON RADIATION
WAVEGUIDES