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Title: Efficient modeling of Bragg coherent x-ray nanobeam diffraction

X-ray Bragg diffraction experiments that utilize tightly focused coherent beams produce complicated Bragg diffraction patterns that depend on scattering geometry, characteristics of the sample, and properties of the x-ray focusing optic. In this paper, we use a Fourier-transform-based method of modeling the 2D intensity distribution of a Bragg peak and apply it to the case of thin films illuminated with a Fresnel zone plate in three different Bragg scattering geometries. Finally, the calculations agree well with experimental coherent diffraction patterns, demonstrating that nanodiffraction patterns can be modeled at nonsymmetric Bragg conditions with this approach—a capability critical for advancing nanofocused x-ray diffraction microscopy.
 [1] ;  [2] ;  [3] ;  [3] ;  [4] ;  [5] ;  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
  3. Aix-Marseille Univ., Marseille (France). CNRS. Fresnel Inst.
  4. Columbia Univ., New York, NY (United States). Dept. of Applied Physics and Mathematics
  5. Thomas J. Watson Research Center, Yorktown Heights, NY (United States). IBM Corporation
Publication Date:
OSTI Identifier:
Grant/Contract Number:
AC02-06CH11357; ANR-11-BS10-0005
Accepted Manuscript
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 40; Journal Issue: 14; Journal ID: ISSN 0146-9592
Optical Society of America (OSA)
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States); Aix-Marseille Univ., Marseille (France)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Agency for Research (ANR) (France)
Contributing Orgs:
Columbia Univ., New York, NY (United States); Thomas J. Watson Research Center, Yorktown Heights, NY (United States)
Country of Publication:
United States
36 MATERIALS SCIENCE; Diffractive optics; Far field diffraction; High numerical aperture optics; Ptychography; Scanning probe microscopy; X ray optics; Coherence; Synchrotron radiation