skip to main content

This content will become publicly available on September 26, 2017

Title: Using Atom-Probe Tomography to Understand Zn O ? Al / Si O 2 / Si Schottky Diodes

Authors:
; ; ; ; ;
Publication Date:
OSTI Identifier:
1326861
Grant/Contract Number:
EE0004946
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Applied
Additional Journal Information:
Journal Volume: 6; Journal Issue: 3; Related Information: CHORUS Timestamp: 2017-06-24 19:45:00; Journal ID: ISSN 2331-7019
Publisher:
American Physical Society
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English