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Title: On the scaling of multicrystal data sets collected at high-intensity X-ray and electron sources

Here, the need for data-scaling has become increasingly evident as time-resolved pump-probe photocrystallography is rapidly developing at high intensity X-ray sources. Several aspects of the scaling of data sets collected at synchrotrons, XFELs (X-ray Free Electron Lasers) and high-intensity pulsed electron sources are discussed. They include laser-ON/laser-OFF data scaling, inter- and intra-data set scaling. (C) 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
 [1] ;  [2]
  1. Univ. at Buffalo, State Univ. of New York, Buffalo, NY (United States)
  2. Univ. at Buffalo, State Univ. of New York, Buffalo, NY (United States); Univ. de Lorraine, Vandoeuvre-les-Nancy Cedex (France)
Publication Date:
OSTI Identifier:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Structural Dynamics
Additional Journal Information:
Journal Volume: 2; Journal Issue: 6; Journal ID: ISSN 2329-7778
American Crystallographic Association/AIP
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; resolved laue diffraction; photochemistry; complexes; data sets; anisotropy; electron sources; X-ray lasers; free electron lasers