Electronic effects in high-energy radiation damage in tungsten
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division; Queen Mary University of London, London (United Kingdom)
- Univ. College London, Bloomsbury (United Kingdom). London Centre for Nanotechnology, Department of Physics and Astronomy
- Univ. of Helsinki (Finland)
- STFC Daresbury Laboratory, Daresbury, Warrington, Cheshire (United Kingdom). Scientific Computing Department
- STFC Daresbury Laboratory, Daresbury, Warrington, Cheshire (United Kingdom). Scientific Computing Department
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division; Univ. of Tennessee, Knoxville, TN (United States). Department of Materials Science and Engineering
- Queen Mary University of London, London (United Kingdom)
Even though the effects of the electronic excitations during high-energy radiation damage processes are not currently understood, it is shown that their role in the interaction of radiation with matter is important. We perform molecular dynamics simulations of high-energy collision cascades in bcc-tungsten using the coupled two-temperature molecular dynamics (2T-MD) model that incorporates both the effects of electronic stopping and electron–phonon interaction. We compare the combination of these effects on the induced damage with only the effect of electronic stopping, and conclude in several novel insights. In the 2T-MD model, the electron–phonon coupling results in less damage production in the molten region and in faster relaxation of the damage at short times. We show these two effects lead to a significantly smaller amount of the final damage at longer times.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1265368
- Journal Information:
- Journal of Physics. Condensed Matter, Vol. 27, Issue 13; ISSN 0953-8984
- Publisher:
- IOP PublishingCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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