Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111)
- Ghent Univ. (Belgium)
- KU Leuven (Belgium)
- Univ. of Antwerp (Belgium)
- IBM T.J. Watson Research Center, Yorktown Heights, NY (United States)
- Univ. of Cape Town, Rondebosch (South Africa); iThemba LABs, Somerset West (South Africa)
We studied the solid-phase reaction between a thin Ni film and a single crystal Ge(001) or Ge(111) substrate during a ramp anneal. The phase formation sequence was determined using in situ X-ray diffraction and in situ Rutherford backscattering spectrometry (RBS), while the nature and the texture of the phases were studied using X-ray pole figures and transmission electron microscopy. The phase sequence is characterized by the formation of a single transient phase before NiGe forms as the final and stable phase. X-ray pole figures were used to unambiguously identify the transient phase as the ϵ-phase, a non-stoichiometric Ni-rich germanide with a hexagonal crystal structure that can exist for Ge concentrations between 34% and 48% and which forms with a different epitaxial texture on both substrate orientations. Here, the complementary information gained from both RBS and X-ray pole figure measurements revealed a simultaneous growth of both the ϵ-phase and NiGe over a small temperature window on both substrate orientations.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); European Research Council (ERC)
- Grant/Contract Number:
- SC00112704; AC02-98CH10886; #335078-COLOURATOMS; GOA/14/007; GOA 01G01513
- OSTI ID:
- 1354477
- Alternate ID(s):
- OSTI ID: 1245504
- Report Number(s):
- BNL-112994-2016-JA; JAPIAU
- Journal Information:
- Journal of Applied Physics, Vol. 119, Issue 13; ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
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journal | March 2018 |
Impact of Pt on the phase formation sequence, morphology, and electrical properties of Ni(Pt)/Ge 0.9 Sn 0.1 system during solid-state reaction
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journal | August 2018 |
Ni/GeSn solid-state reaction monitored by combined X-ray diffraction analyses: focus on the Ni-rich phase
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journal | July 2018 |
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