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Title: Performance and Reliability of Bonded Interfaces for High-Temperature Packaging (Presentation)

The thermal performance and reliability of sintered-silver is being evaluated for power electronics packaging applications. This will be experimentally accomplished by the synthesis of large-area bonded interfaces between metalized substrates that will be subsequently subjected to thermal cycles. A finite element model of crack initiation and propagation in these bonded interfaces will allow for the interpretation of degradation rates by a crack-velocity (V)-stress intensity factor (K) analysis. The experiment is outlined, and the modeling approach is discussed.
Authors:
Publication Date:
OSTI Identifier:
1168772
Report Number(s):
NREL/PR-5400-63003
DOE Contract Number:
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at the FY15 APEEM Kickoff Meeting, 18-20 November 2014, Oak Ridge National Laboratory, Oak Ridge, Tennessee; Related Information: NREL (National Renewable Energy Laboratory)
Research Org:
National Renewable Energy Laboratory (NREL), Golden, CO.
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy Vehicle Technologies Office
Country of Publication:
United States
Language:
English
Subject:
33 ADVANCED PROPULSION SYSTEMS; 30 DIRECT ENERGY CONVERSION BONDED INTERFACES; SINTERED-SILVER; RELIABILITY; DELAMINATION; STRESS INTENSITY FACTOR