Observations of artefacts in the x-ray ptychography method

Journal Article · Mon May 05 00:00:00 EDT 2014 · Optics Express

DOI:https://doi.org/10.1364/OE.22.010294· OSTI ID:1162773

Burdet, N.; Morrison, G.; Huang, X.; Shi, X.; Clark, J.; Zhang, F.; Civita, M.; Harder, R.; Robinson, I.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE SC OFFICE OF SCIENCE (SC)
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 1162773
• Report Number(s): BNL-106719-2014-JA
• Journal Information: Optics Express, Vol. 22, Issue 9; ISSN 1094--4087
• Country of Publication: United States
• Language: English