Characterization of two different orientations of epitaxial niobium thin films grown on MgO(001) surfaces
- William and Mary College
- JLAB
Epitaxial Nb thin films deposited onto the same crystalline insulating surface can evolve in very different fashions depending on specific deposition conditions, thereby affecting their microstructure, surface morphology and superconducting properties. Here, we examine and compare the microstructure and ensuing surface morphology from two distinct Nb/MgO series each with its own epitaxial registry?namely Nb(001)/MgO(001) and Nb(110)/MgO(001)?leading to distinct surface anisotropy and we closely examine the dynamical scaling of the surface features during growth. We compare our findings with those in other metal/MgO epitaxial systems and for the first time, general scaling formalism is applied to analyze anisotropic surfaces exhibiting biaxial symmetry. Further, Power Spectral Density is applied to the specific problem of thin film growth and surface evolution to qualify the set of deposition conditions leading to smoother surfaces. We find good correlation between the surface morphology and microstructure of the various Nb films with superconducting properties such as their residual resistance ratio and lower critical field.
- Research Organization:
- Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- AC05-06OR23177
- OSTI ID:
- 1109492
- Report Number(s):
- JLAB-ACC-13-1823; DOE/OR/23177-2938; DTRA HDTRA1-10-1-0072
- Journal Information:
- J. Appl. Phys., Vol. 114, Issue 22
- Country of Publication:
- United States
- Language:
- English
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