Optical Constants Determination of Samarium Holmium and Erbium in the 1.5-850 eV Spectral Range using a Transmittance Method
The optical constants {beta} and {sigma} of the complex refractive index {tilde n} = 1 - {delta} + i{beta} of Sm, Ho, and Er were obtained in the 1.5-850 eV energy range using a transmittance method. Thin films of Sm, Ho, and Dr were deposited by magnetron sputtering, and transmittance was measured using synchrotron radiation using a high vacuum condition. All films were directly coated on Si photodiodes, which were used as coating substrates, as well as photon detectors. Si was used as capping layer while a thin W layer was used as barrier against interface diffusion between Si and the highly reactive rare earth elements. The constants {beta} were extracted from transmittance results, and the constants {sigma} were calculated based on measured {beta} values using the Kramers-Kronig formalism. Small deficiencies determined from the present data using the partial sum rules were partially attributed to the sputtered film densities that could be slightly lower than the bulk values.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE SC OFFICE OF SCIENCE (SC)
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 1041808
- Report Number(s):
- BNL-97486-2012-JA; APOPAI; TRN: US201212%%220
- Journal Information:
- Applied Optics, Vol. 49; ISSN 0003-6935
- Country of Publication:
- United States
- Language:
- English
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