Spatially Resolved Mapping of Disorder Type and Distribution in Random Systems using Artificial Neural Network Recognition

Journal Article · Sat Jan 01 00:00:00 EST 2011 · Physical Review B

OSTI ID:1033987

Jesse, Stephen ^[1]; Kalinin, Sergei V ^[1]; Kumar, Amit ^[1]; Ovchinnikov, Oleg S ^[1]; Guo, Senli ^[1]; Griggio, Flavio ^[1]; Trolier-Mckinstry, Susan E ^[1]

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1. ORNL

The spatial variability of the polarization dynamics in thin film ferroelectric capacitors was probed by recognition analysis of spatially-resolved spectroscopic data. Switching spectroscopy piezoresponse force microscopy was used to measure local hysteresis loops and map them on a 2D random-bond, random-field Ising model. A neural-network based recognition approach was utilized to analyze the hysteresis loops and their spatial variability. Strong variability is observed in the polarization dynamics around macroscopic cracks due to the modified local elastic and electric boundary conditions, with most pronounced effect on the length scale of ~100 nm away from the crack.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1033987
• Journal Information: Physical Review B, Vol. 84, Issue 2; ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BOUNDARY CONDITIONS
CAPACITORS
DISTRIBUTION
HYSTERESIS
ISING MODEL
MICROSCOPY
NEURAL NETWORKS
POLARIZATION
SPECTROSCOPY
THIN FILMS
Disorder
ANN
Hysteresis