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Title: Interfacial Widths of Conjugated Polymer Bilayers

The interfaces of conjugated polyelectrolyte (CPE)/poly[2-methoxy-5-(2{prime}-ethylhexyloxy)-p-phenylene vinylene] (MEH-PPV) bilayers cast from differential solvents are shown by resonant soft X-ray reflectivity (RSoXR) to be very smooth and sharp. The chemical interdiffusion due to casting is limited to less than 0.6 nm, and the interface created is thus nearly 'molecularly' sharp. These results demonstrate for the first time and with high precision that the nonpolar MEH-PPV layer is not much disturbed by casting the CPE layer from a polar solvent. A baseline is established for understanding the role of interfacial structure in determining the performance of CPE-based polymer light-emitting diodes. More broadly, we anticipate further applications of RSoXR as an important tool in achieving a deeper understanding of other multilayer organic optoelectronic devices, including multilayer photovoltaic devices.
Authors:
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Publication Date:
OSTI Identifier:
1023375
Report Number(s):
LBNL-4689E
Journal ID: ISSN 0002-7863; JACSAT; TRN: US201118%%973
DOE Contract Number:
DE-AC02-05CH11231
Resource Type:
Journal Article
Resource Relation:
Journal Name: JACS; Journal Volume: 131; Journal Issue: 35
Research Org:
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
Sponsoring Org:
Advanced Light Source Division
Country of Publication:
United States
Language:
English
Subject:
36; ACCURACY; CASTING; PERFORMANCE; POLYMERS; REFLECTIVITY; SOLVENTS