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Title: Boosting the Light: X-ray Physics in Confinement

Remarkable effects are observed if light is confined to dimensions comparable to the wavelength of the light. The lifetime of atomic resonances excited by the radiation is strongly reduced in photonimore »c traps, such as cavities or waveguides. Moreover, one observes an anomalous boost of the intensity scattered from the resonant atoms. These phenomena results from the strong enhancement of the photonic density of states in such geometries. Many of these effects are currently being explored in the regime of vsible light due to their relevance for optical information processing. It is thus appealing to study these phenomena also for much shorter wavelengths. This talk illuminates recent experiments where synchrotron x-rays were trapped in planar waveguides to resonantly excite atomos ([57]Fe nuclei_ embedded in them. In fact, one observes that the radiative decay of these excited atoms is strongly accelerated. The temporal acceleration of the decay goes along with a strong boost of the radiation coherently scattered from the confined atmos. This can be exploited to obtain a high signal-to-noise ratio from tiny quantities of material, leading to manifold applications in the investigation of nanostructured materials. One application is the use of ultrathin probe layers to image the internal structure of magnetic layer systems.« less
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Title: Boosting the Light: X-ray Physics in Confinement
Authors:
Publication Date: 2006-03-01
OSTI Identifier: 1007179
DOE Contract Number: ACO2-06CH11357
Resource Type: Multimedia
Resource Relation: Conference: APS Colloquium Series, Advanced Photon Source (APS) at Argonne National Laboratory, Argonne, Illinois (United States), presented on March 01, 2006
Research Org: ANL (Argonne National Laboratory (ANL), Argonne, IL (United States))
Sponsoring Org: USDOE Office of Science (SC)
Subject: 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Country of Publication: United States
Language: English
Run Time: 1:02:07
System Entry Date: 2016-01-27