In situ synchrotron x-ray studies of epitaxial SrCoOx films during ionic liquid gating

Li, Yan; Wenderott, Jill K.; Billo, Tadesse; Wang, Maoyu; Chang, Alvin; Cao, Hui; Yan, Xi; Buchholz, D. Bruce; Feng, Zhenxing; Zhou, Hua; Guha, Supratik; Fong, Dillon D.

doi:10.1063/5.0269796

Title: In situ synchrotron x-ray studies of epitaxial SrCoO_x films during ionic liquid gating

Journal Article · Wed Jun 04 00:00:00 UTC 2025 · APL Materials

DOI: https://doi.org/10.1063/5.0269796 · OSTI ID:3006361

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Argonne National Laboratory (ANL), Argonne, IL (United States)
Argonne National Laboratory (ANL), Argonne, IL (United States); Drexel Univ., Philadelphia, PA (United States)
Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Oregon State Univ., Corvallis, OR (United States)
Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. at Buffalo, NY (United States)
Northwestern Univ., Evanston, IL (United States)
Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)

The manipulation of ions in complex oxide materials can be used to mimic brain-like plasticity through changes to the resistivity of a neuromorphic device. Advances in the design of more energy efficient devices require improved understanding of how ions migrate within a material and across its interface. We investigate the exchange of oxygen and hydrogen in a model SrCoO_x epitaxial film—a material that transitions between a ferromagnetic metal and antiferromagnetic insulator depending on the oxygen concentration. Changes to the film during ionic liquid gating were measured by in situ synchrotron x-ray techniques as a function of time and gate voltage, examining the reversibility of the oxide over one complete gating cycle. We find that the out-of-plane lattice constant and oxygen vacancy concentration of SrCoO_x are largely reversible although changes were observed in the ordered vacancy structure. Our results provide much needed insight into electrolyte-gated phase behavior in the transition metal oxides.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 3006361

Journal Information:: APL Materials, Journal Name: APL Materials Journal Issue: 6 Vol. 13; ISSN 2166-532X

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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