Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers
Abstract
Abstract The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$$$10^{12}$$$$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
- Authors:
- more »
- Publication Date:
- Research Org.:
- SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Fusion Energy Sciences (FES); USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP)
- OSTI Identifier:
- 2202703
- Alternate Identifier(s):
- OSTI ID: 2308810
- Grant/Contract Number:
- contract DE-AC02-76SF00515; AC02-76SF00515; AC52-07NA27344; NA0003624; DOE/NV/03624-1478
- Resource Type:
- Published Article
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Name: Scientific Reports Journal Volume: 13 Journal Issue: 1; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United Kingdom
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; materials science; microscopy; optics and photonics
Citation Formats
Dresselhaus-Marais, Leora E., Kozioziemski, Bernard, Holstad, Theodor S., Ræder, Trygve Magnus, Seaberg, Matthew, Nam, Daewoong, Kim, Sangsoo, Breckling, Sean, Choi, Sungwook, Chollet, Matthieu, Cook, Philip K., Folsom, Eric, Galtier, Eric, Gonzalez, Arnulfo, Gorkhover, Tais, Guillet, Serge, Haldrup, Kristoffer, Howard, Marylesa, Katagiri, Kento, Kim, Seonghan, Kim, Sunam, Kim, Sungwon, Kim, Hyunjung, Knudsen, Erik Bergbäck, Kuschel, Stephan, Lee, Hae Ja, Lin, Chuanlong, McWilliams, R. Stewart, Nagler, Bob, Nielsen, Martin Meedom, Ozaki, Norimasa, Pal, Dayeeta, Pablo Pedro, Ricardo, Saunders, Alison M., Schoofs, Frank, Sekine, Toshimori, Simons, Hugh, van Driel, Tim, Wang, Bihan, Yang, Wenge, Yildirim, Can, Poulsen, Henning Friis, and Eggert, Jon H. Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers. United Kingdom: N. p., 2023.
Web. doi:10.1038/s41598-023-35526-5.
Dresselhaus-Marais, Leora E., Kozioziemski, Bernard, Holstad, Theodor S., Ræder, Trygve Magnus, Seaberg, Matthew, Nam, Daewoong, Kim, Sangsoo, Breckling, Sean, Choi, Sungwook, Chollet, Matthieu, Cook, Philip K., Folsom, Eric, Galtier, Eric, Gonzalez, Arnulfo, Gorkhover, Tais, Guillet, Serge, Haldrup, Kristoffer, Howard, Marylesa, Katagiri, Kento, Kim, Seonghan, Kim, Sunam, Kim, Sungwon, Kim, Hyunjung, Knudsen, Erik Bergbäck, Kuschel, Stephan, Lee, Hae Ja, Lin, Chuanlong, McWilliams, R. Stewart, Nagler, Bob, Nielsen, Martin Meedom, Ozaki, Norimasa, Pal, Dayeeta, Pablo Pedro, Ricardo, Saunders, Alison M., Schoofs, Frank, Sekine, Toshimori, Simons, Hugh, van Driel, Tim, Wang, Bihan, Yang, Wenge, Yildirim, Can, Poulsen, Henning Friis, & Eggert, Jon H. Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers. United Kingdom. https://doi.org/10.1038/s41598-023-35526-5
Dresselhaus-Marais, Leora E., Kozioziemski, Bernard, Holstad, Theodor S., Ræder, Trygve Magnus, Seaberg, Matthew, Nam, Daewoong, Kim, Sangsoo, Breckling, Sean, Choi, Sungwook, Chollet, Matthieu, Cook, Philip K., Folsom, Eric, Galtier, Eric, Gonzalez, Arnulfo, Gorkhover, Tais, Guillet, Serge, Haldrup, Kristoffer, Howard, Marylesa, Katagiri, Kento, Kim, Seonghan, Kim, Sunam, Kim, Sungwon, Kim, Hyunjung, Knudsen, Erik Bergbäck, Kuschel, Stephan, Lee, Hae Ja, Lin, Chuanlong, McWilliams, R. Stewart, Nagler, Bob, Nielsen, Martin Meedom, Ozaki, Norimasa, Pal, Dayeeta, Pablo Pedro, Ricardo, Saunders, Alison M., Schoofs, Frank, Sekine, Toshimori, Simons, Hugh, van Driel, Tim, Wang, Bihan, Yang, Wenge, Yildirim, Can, Poulsen, Henning Friis, and Eggert, Jon H. Mon .
"Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers". United Kingdom. https://doi.org/10.1038/s41598-023-35526-5.
@article{osti_2202703,
title = {Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers},
author = {Dresselhaus-Marais, Leora E. and Kozioziemski, Bernard and Holstad, Theodor S. and Ræder, Trygve Magnus and Seaberg, Matthew and Nam, Daewoong and Kim, Sangsoo and Breckling, Sean and Choi, Sungwook and Chollet, Matthieu and Cook, Philip K. and Folsom, Eric and Galtier, Eric and Gonzalez, Arnulfo and Gorkhover, Tais and Guillet, Serge and Haldrup, Kristoffer and Howard, Marylesa and Katagiri, Kento and Kim, Seonghan and Kim, Sunam and Kim, Sungwon and Kim, Hyunjung and Knudsen, Erik Bergbäck and Kuschel, Stephan and Lee, Hae Ja and Lin, Chuanlong and McWilliams, R. Stewart and Nagler, Bob and Nielsen, Martin Meedom and Ozaki, Norimasa and Pal, Dayeeta and Pablo Pedro, Ricardo and Saunders, Alison M. and Schoofs, Frank and Sekine, Toshimori and Simons, Hugh and van Driel, Tim and Wang, Bihan and Yang, Wenge and Yildirim, Can and Poulsen, Henning Friis and Eggert, Jon H.},
abstractNote = {Abstract The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$10^{12}$$ 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.},
doi = {10.1038/s41598-023-35526-5},
journal = {Scientific Reports},
number = 1,
volume = 13,
place = {United Kingdom},
year = {Mon Oct 16 00:00:00 EDT 2023},
month = {Mon Oct 16 00:00:00 EDT 2023}
}
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