Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Journal Article · 15 October 2023 · Scientific Reports

DOI: https://doi.org/10.1038/s41598-023-35526-5 · OSTI ID:2202703

Dresselhaus-Marais, Leora E.; Kozioziemski, Bernard; Holstad, Theodor S.; Ræder, Trygve Magnus; Seaberg, Matthew; Nam, Daewoong; Kim, Sangsoo; Breckling, Sean; Choi, Sungwook; Chollet, Matthieu; Cook, Philip K.; Folsom, Eric; Galtier, Eric; Gonzalez, Arnulfo; Gorkhover, Tais; Guillet, Serge; Haldrup, Kristoffer; Howard, Marylesa; Katagiri, Kento; Kim, Seonghan ; Kim, Sunam; Kim, Sungwon; Kim, Hyunjung; Knudsen, Erik Bergbäck; Kuschel, Stephan; Lee, Hae Ja; Lin, Chuanlong; McWilliams, R. Stewart; Nagler, Bob; Nielsen, Martin Meedom; Ozaki, Norimasa; Pal, Dayeeta; Pablo Pedro, Ricardo; Saunders, Alison M.; Schoofs, Frank; Sekine, Toshimori; Simons, Hugh; van Driel, Tim; Wang, Bihan; Yang, Wenge; Yildirim, Can; Poulsen, Henning Friis; Eggert, Jon H.

Abstract The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$$$10^{12}$$$$ ${10}^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP); USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Fusion Energy Sciences (FES)
• Grant/Contract Number: AC02-76SF00515; AC52-07NA27344; NA0003624
• OSTI ID: 2202703
• Journal Information: Scientific Reports, Journal Name: Scientific Reports Journal Issue: 1 Vol. 13; ISSN 2045-2322
• Publisher: Nature Publishing GroupCopyright Statement
• Country of Publication: United Kingdom
• Language: English