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Title: Efficiency and Forward Voltage of Blue and Green Lateral LEDs with V-shaped Defects and Random Alloy Fluctuation in Quantum Wells

Abstract

For nitride-based blue and green light-emitting diodes (LEDs), the forward voltage Vfor is larger than expected, especially for green LEDs. This is mainly due to the large barriers to vertical carrier transport caused by the total polarization discontinuity at multiple quantum well and quantum barrier interfaces. The natural random alloy fluctuation in quantum wells has proven to be an important factor reducing Vfor. However, this does not suffice in the case of green LEDs because of their larger polarization-induced barrier. V-shaped defects (V-defects) have been proposed as another key factor in reducing Vfor to allow lateral injection into multiple quantum wells, thus bypassing the multiple energy barriers incurred by vertical transport. In this paper, to model carrier transport in the whole LED, we consider both random-alloy and V-defect effects. A fully two-dimensional drift-diffusion charge-control solver is used to model both effects. The results indicate that the turn-on voltages for blue and green LEDs are both affected by random alloy fluctuations and the V-defect density. For green LEDs, Vfor decreases more due to V-defects, where the smaller polarization barrier at the V-defect sidewall is the major path for lateral carrier injection. Then, we discuss how the V-defect density and size affectsmore » the results.« less

Authors:
 [1];  [2];  [3]; ORCiD logo [4]
  1. National Taiwan University, Taipei (Taiwan)
  2. University of California, Santa Barbara, CA (United States)
  3. University of California, Santa Barbara, CA (United States); Centre de Recherche en Gestion - Ecole Polytechnique / CNRS, Palaiseau (France)
  4. National Taiwan University, Taipei (Taiwan); Industrial Technology Research Laboratories, Hsinchu (Taiwan)
Publication Date:
Research Org.:
Univ. of California, Santa Barbara, CA (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE); Ministry of Science and Technology, Taiwan; National Science Foundation (NSF); Simons Foundation; French Agence Nationale de la Re-cherche (ANR)
OSTI Identifier:
1979642
Grant/Contract Number:  
EE0009691; MOST 108-2628-E-002- 010-MY3; MOST 110-2923-E-002-002; MOST 111- 2923-E-002-009; DMS-1839077; 601952; 601954; ANR-20-CE05-0037-01
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Applied
Additional Journal Information:
Journal Volume: 17; Journal Issue: 1; Journal ID: ISSN 2331-7019
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; carrier dynamics; carrier generation and recombination; classical transport; optoelectronics; disordered alloys; III-V semiconductors; LEDs: quantum wells

Citation Formats

Ho, Cheng-Han, Speck, James S., Weisbuch, Claude, and Wu, Yuh-Renn. Efficiency and Forward Voltage of Blue and Green Lateral LEDs with V-shaped Defects and Random Alloy Fluctuation in Quantum Wells. United States: N. p., 2022. Web. doi:10.1103/physrevapplied.17.014033.
Ho, Cheng-Han, Speck, James S., Weisbuch, Claude, & Wu, Yuh-Renn. Efficiency and Forward Voltage of Blue and Green Lateral LEDs with V-shaped Defects and Random Alloy Fluctuation in Quantum Wells. United States. https://doi.org/10.1103/physrevapplied.17.014033
Ho, Cheng-Han, Speck, James S., Weisbuch, Claude, and Wu, Yuh-Renn. Tue . "Efficiency and Forward Voltage of Blue and Green Lateral LEDs with V-shaped Defects and Random Alloy Fluctuation in Quantum Wells". United States. https://doi.org/10.1103/physrevapplied.17.014033. https://www.osti.gov/servlets/purl/1979642.
@article{osti_1979642,
title = {Efficiency and Forward Voltage of Blue and Green Lateral LEDs with V-shaped Defects and Random Alloy Fluctuation in Quantum Wells},
author = {Ho, Cheng-Han and Speck, James S. and Weisbuch, Claude and Wu, Yuh-Renn},
abstractNote = {For nitride-based blue and green light-emitting diodes (LEDs), the forward voltage Vfor is larger than expected, especially for green LEDs. This is mainly due to the large barriers to vertical carrier transport caused by the total polarization discontinuity at multiple quantum well and quantum barrier interfaces. The natural random alloy fluctuation in quantum wells has proven to be an important factor reducing Vfor. However, this does not suffice in the case of green LEDs because of their larger polarization-induced barrier. V-shaped defects (V-defects) have been proposed as another key factor in reducing Vfor to allow lateral injection into multiple quantum wells, thus bypassing the multiple energy barriers incurred by vertical transport. In this paper, to model carrier transport in the whole LED, we consider both random-alloy and V-defect effects. A fully two-dimensional drift-diffusion charge-control solver is used to model both effects. The results indicate that the turn-on voltages for blue and green LEDs are both affected by random alloy fluctuations and the V-defect density. For green LEDs, Vfor decreases more due to V-defects, where the smaller polarization barrier at the V-defect sidewall is the major path for lateral carrier injection. Then, we discuss how the V-defect density and size affects the results.},
doi = {10.1103/physrevapplied.17.014033},
journal = {Physical Review Applied},
number = 1,
volume = 17,
place = {United States},
year = {Tue Jan 25 00:00:00 EST 2022},
month = {Tue Jan 25 00:00:00 EST 2022}
}

Works referenced in this record:

Universal mechanism for Anderson and weak localization
journal, August 2012

  • Filoche, M.; Mayboroda, S.
  • Proceedings of the National Academy of Sciences, Vol. 109, Issue 37
  • DOI: 10.1073/pnas.1120432109

Modeling dislocation-related leakage currents in GaN p-n diodes
journal, December 2019

  • Robertson, C. A.; Qwah, K. S.; Wu, Y. -R.
  • Journal of Applied Physics, Vol. 126, Issue 24
  • DOI: 10.1063/1.5123394

Effect of quantum well cap layer thickness on the microstructure and performance of InGaN/GaN solar cells
journal, April 2012

  • Hu, Yan-Ling; Farrell, Robert M.; Neufeld, Carl J.
  • Applied Physics Letters, Vol. 100, Issue 16
  • DOI: 10.1063/1.4704189

Simulating random alloy effects in III-nitride light emitting diodes
journal, July 2020

  • Di Vito, A.; Pecchia, A.; Di Carlo, A.
  • Journal of Applied Physics, Vol. 128, Issue 4
  • DOI: 10.1063/5.0005862

3D numerical modeling of the carrier transport and radiative efficiency for InGaN/GaN light emitting diodes with V-shaped pits
journal, May 2016

  • Li, Chi-Kang; Wu, Chen-Kuo; Hsu, Chung-Cheng
  • AIP Advances, Vol. 6, Issue 5
  • DOI: 10.1063/1.4950771

Barriers to carrier transport in multiple quantum well nitride-based c -plane green light emitting diodes
journal, May 2020


Impact of dislocations and defects on the relaxation behavior of InGaN/GaN multiple quantum wells grown on Si and sapphire substrates
journal, March 2015

  • Yoshida, Hisashi; Hikosaka, Toshiki; Nago, Hajime
  • physica status solidi (b), Vol. 252, Issue 5
  • DOI: 10.1002/pssb.201451585

Localization landscape theory of disorder in semiconductors. II. Urbach tails of disordered quantum well layers
journal, April 2017


Structure and formation mechanism of V defects in multiple InGaN∕GaN quantum well layers
journal, April 2006

  • Shiojiri, M.; Chuo, C. C.; Hsu, J. T.
  • Journal of Applied Physics, Vol. 99, Issue 7
  • DOI: 10.1063/1.2180532

Localization landscape theory of disorder in semiconductors. I. Theory and modeling
journal, April 2017


Carriers capturing of V-defect and its effect on leakage current and electroluminescence in InGaN-based light-emitting diodes
journal, December 2012

  • Le, L. C.; Zhao, D. G.; Jiang, D. S.
  • Applied Physics Letters, Vol. 101, Issue 25
  • DOI: 10.1063/1.4772548

Manipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wells
journal, March 2015

  • Chang, Chiao-Yun; Li, Heng; Shih, Yang-Ta
  • Applied Physics Letters, Vol. 106, Issue 9
  • DOI: 10.1063/1.4914116

A 3D simulation comparison of carrier transport in green and blue c-plane multi-quantum well nitride light emitting diodes
journal, December 2020

  • Lheureux, Guillaume; Lynsky, Cheyenne; Wu, Yuh-Renn
  • Journal of Applied Physics, Vol. 128, Issue 23
  • DOI: 10.1063/1.5143276

Electroluminescence from the sidewall quantum wells in the V-shaped pits of InGaN light emitting diodes
journal, June 2014

  • Wu, Xiaoming; Liu, Junlin; Quan, Zhijue
  • Applied Physics Letters, Vol. 104, Issue 22
  • DOI: 10.1063/1.4880731

The influence of random indium alloy fluctuations in indium gallium nitride quantum wells on the device behavior
journal, September 2014

  • Yang, Tsung-Jui; Shivaraman, Ravi; Speck, James S.
  • Journal of Applied Physics, Vol. 116, Issue 11
  • DOI: 10.1063/1.4896103

Investigating the Efficiency Droop of Nitride-Based Blue LEDs with Different Quantum Barrier Growth Rates
journal, December 2019


Atomic scale characterization of GaInN/GaN multiple quantum wells in V-shaped pits
journal, May 2011

  • Tomiya, Shigetaka; Kanitani, Yuya; Tanaka, Shinji
  • Applied Physics Letters, Vol. 98, Issue 18
  • DOI: 10.1063/1.3585118

Rate equation analysis of efficiency droop in InGaN light-emitting diodes
journal, August 2009

  • Ryu, Han-Youl; Kim, Hyun-Sung; Shim, Jong-In
  • Applied Physics Letters, Vol. 95, Issue 8
  • DOI: 10.1063/1.3216578

Structural origin of V-defects and correlation with localized excitonic centers in InGaN/GaN multiple quantum wells
journal, February 1998

  • Wu, X. H.; Elsass, C. R.; Abare, A.
  • Applied Physics Letters, Vol. 72, Issue 6
  • DOI: 10.1063/1.120844

Effective Confining Potential of Quantum States in Disordered Media
journal, February 2016


Analysis of defect-related inhomogeneous electroluminescence in InGaN/GaN QW LEDs
journal, November 2016


Indirect Auger recombination as a cause of efficiency droop in nitride light-emitting diodes
journal, April 2011

  • Kioupakis, Emmanouil; Rinke, Patrick; Delaney, Kris T.
  • Applied Physics Letters, Vol. 98, Issue 16
  • DOI: 10.1063/1.3570656

Dislocation effect on light emission efficiency in gallium nitride
journal, December 2002

  • Karpov, Sergey Yu.; Makarov, Yuri N.
  • Applied Physics Letters, Vol. 81, Issue 25
  • DOI: 10.1063/1.1527225

High dislocation densities in high efficiency GaN‐based light‐emitting diodes
journal, March 1995

  • Lester, S. D.; Ponce, F. A.; Craford, M. G.
  • Applied Physics Letters, Vol. 66, Issue 10
  • DOI: 10.1063/1.113252

Nanoscale Characterization of V-defect in InGaN/GaN QWs LEDs using Near-Field Scanning Optical Microscopy
journal, April 2019

  • Li, Yufeng; Tang, Weihan; Zhang, Ye
  • Nanomaterials, Vol. 9, Issue 4, p. 633
  • DOI: 10.3390/nano9040633

Nature of V-Shaped Defects in GaN
journal, May 2013

  • Voronenkov, Vladislav; Bochkareva, Natalia; Gorbunov, Ruslan
  • Japanese Journal of Applied Physics, Vol. 52, Issue 8S
  • DOI: 10.7567/JJAP.52.08JE14

Strain-induced polarization in wurtzite III-nitride semipolar layers
journal, July 2006

  • Romanov, A. E.; Baker, T. J.; Nakamura, S.
  • Journal of Applied Physics, Vol. 100, Issue 2
  • DOI: 10.1063/1.2218385

V-pit pinning at the interface of high and low-temperature gallium nitride growth
journal, May 2019

  • Bouveyron, Romain; Mrad, Mrad; Charles, Matthew
  • Japanese Journal of Applied Physics, Vol. 58, Issue SC
  • DOI: 10.7567/1347-4065/ab09d8

Three dimensional simulation on the transport and quantum efficiency of UVC-LEDs with random alloy fluctuations
journal, October 2018

  • Chen, Hung-Hsiang; Speck, James S.; Weisbuch, Claude
  • Applied Physics Letters, Vol. 113, Issue 15
  • DOI: 10.1063/1.5051081

Role of V-defect density on the performance of III-nitride green LEDs on sapphire substrates
journal, April 2021


Efficiency Drop in Green InGaN / GaN Light Emitting Diodes: The Role of Random Alloy Fluctuations
journal, January 2016


Quantum efficiency affected by localized carrier distribution near the V-defect in GaN based quantum well
journal, December 2013

  • Cho, Yong-Hee; Kim, Jun-Youn; Kim, Jaekyun
  • Applied Physics Letters, Vol. 103, Issue 26
  • DOI: 10.1063/1.4856435

Efficient InGaN-based yellow-light-emitting diodes
journal, January 2019

  • Jiang, Fengyi; Zhang, Jianli; Xu, Longquan
  • Photonics Research, Vol. 7, Issue 2
  • DOI: 10.1364/PRJ.7.000144

Analyzing the physical properties of InGaN multiple quantum well light emitting diodes from nano scale structure
journal, August 2012

  • Wu, Yuh-Renn; Shivaraman, Ravi; Wang, Kuang-Chung
  • Applied Physics Letters, Vol. 101, Issue 8
  • DOI: 10.1063/1.4747532

Effect of V-shaped Pit area ratio on quantum efficiency of blue InGaN/GaN multiple-quantum well light-emitting diodes
journal, February 2016


Minority carrier diffusion length in GaN: Dislocation density and doping concentration dependence
journal, January 2005

  • Kumakura, K.; Makimoto, T.; Kobayashi, N.
  • Applied Physics Letters, Vol. 86, Issue 5
  • DOI: 10.1063/1.1861116

Theoretical and experimental investigations of vertical hole transport through unipolar AlGaN structures: Impacts of random alloy disorder
journal, July 2020

  • Qwah, K. S.; Monavarian, M.; Lheureux, G.
  • Applied Physics Letters, Vol. 117, Issue 2
  • DOI: 10.1063/5.0006291

Improvement of efficiency and electrical properties using intentionally formed V-shaped pits in InGaN/GaN multiple quantum well light-emitting diodes
journal, June 2013

  • Han, Sang-Heon; Lee, Dong-Yul; Shim, Hyun-Wook
  • Applied Physics Letters, Vol. 102, Issue 25
  • DOI: 10.1063/1.4812810

Review—On The Search for Efficient Solid State Light Emitters: Past, Present, Future
journal, January 2020

  • Weisbuch, Claude
  • ECS Journal of Solid State Science and Technology, Vol. 9, Issue 1
  • DOI: 10.1149/2.0392001JSS