Characterization of a hard X-ray self-seeding diamond crystal orientation

Journal Article · Mon Nov 14 00:00:00 UTC 2022 · Optics Express

DOI: https://doi.org/10.1364/OE.473593 · OSTI ID:1898220

Lutman, Alberto A. ; Decker, Franz-Josef; Halavanau, Aliaksei; Maxwell, Timothy J.; Sato, Takahiro

We present a method to accurately control the photon energies for hard X-ray Self-seeding schemes with a single crystal monochromator in transmissive geometry. The energy calibration is performed by measuring which pairs of the machine pitch and yaw angles for different crystallographic planes reflect the X-ray at the same wavelength. The free parameters of an analytical formula for the self-seeding energies are determined by fitting the observed intersections and the normalized derivative with respect to the pitch and yaw angles in the observed intersections. The method requires a hard X-ray spectrometer, but it does not rely on its absolute energy calibration. Instead, identifying the self-seeded energies above the SASE background or the monochromatic notches within the SASE bandwidth is sufficient for the calibration.

• Research Organization: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
• Sponsoring Organization: USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)
• Grant/Contract Number: AC02-76SF00515
• OSTI ID: 1898220
• Journal Information: Optics Express, Journal Name: Optics Express Journal Issue: 24 Vol. 30; ISSN 1094-4087; ISSN OPEXFF
• Publisher: Optical Society of AmericaCopyright Statement
• Country of Publication: United States
• Language: English