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Title: Non-uniform longitudinal current density induced power saturation in GaAs-based high power diode lasers

Journal Article · · Applied Physics Letters
DOI: https://doi.org/10.1063/5.0020259 · OSTI ID:1880943

The output power of modern 975 nm GaAs-based broad area diode lasers is limited by increasing carrier and photon losses at high bias. Here, we use experiment and one-dimensional calculations on these devices to reveal that higher current densities (and hence higher local recombination rates and higher losses) arise near the front facet due to spatial hole burning and that the non-uniformity is strongly affected by laser geometry, which is more severe for longer resonators and less severe for higher front facet reflectivity. Specifically, we use devices with a segmented p-contact to directly measure the current distribution along the resonator and compare this with laser simulation. Devices with a 6 mm resonator show 29% more current at the front than back, twice as large as the 15% current non-uniformity in devices with a 3 mm resonator. In contrast, increased front facet reflectivity (20% rather than 0.8%) is shown to almost halve the current non-uniformity from 29% to 18% in devices with a 6 mm resonator and reduces power saturation. Although the magnitude of current non-uniformity in experiment and theory is broadly consistent, in experiment, an additional divergence is seen in current flow (and hence recombination rate) near the facets, and earlier power saturation occurs. Finally, we discuss the possible saturation mechanisms that are not included in the simulation.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1880943
Report Number(s):
LLNL-JRNL-811301; 1017807
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 20 Vol. 117; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (19)

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Longitudinal carrier density measurement of high power broad area laser diodes journal January 2002
Control of optical mode distribution through etched microstructures for improved broad area laser performance journal March 2008
Current-crowded carrier confinement in double-heterostructure lasers journal January 1980
Spatial hole burning in high-power edge-emitting lasers: A simple analytical model and the effect on laser performance journal February 2011
Above-threshold longitudinal profiling of carrier nonpinning and spatial modulation in asymmetric cavity lasers journal April 1998
Empirical low-field mobility model for III–V compounds applicable in device simulation codes journal March 2000
Impact of longitudinal refractive index change on the near-field width of high-power broad-area diode lasers journal June 2017
Effect of spatial hole burning on output characteristics of high power edge emitting semiconductor lasers: A universal analytical estimate and numerical analysis journal January 2019
Longitudinal spatial hole burning in high-power semiconductor lasers: numerical analysis journal February 2020
Impact of the capture time on the series resistance of quantum-well diode lasers journal July 2020
Theoretical and experimental investigations of the limits to the maximum output power of laser diodes journal August 2010
Design and Simulation of Next-Generation High-Power, High-Brightness Laser Diodes journal January 2009
Efficient High-Power Laser Diodes journal July 2013
Impact of Carrier Nonpinning Effect on Thermal Power Saturation in GaAs-Based High Power Diode Lasers journal November 2019
What Causes the Pulse Power Saturation of GaAs-Based Broad-Area Lasers? journal May 2018
29.5W continuous wave output from 100um wide laser diode conference March 2015
Traveling wave model-based analysis of tapered broad-area lasers conference March 2020
High d/gamma values in diode laser structures for very high power conference February 2009

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