Defect Characterization Using Positron Annihilation Spectroscopy on Laser-Ablated Surfaces
Abstract
In recent years, short, pulsed laser ablation has been gaining popularity for machining small-scale test geometries from bulk samples and for efficient serial sectioning. These laser-based techniques are being added to the toolbox in material science, which makes it necessary to understand the changes in the material that occur from the laser–material interaction. Positron annihilation spectroscopy is a unique, nondestructive technique to investigate small defects in materials difficult to investigate by other tools. In this work, Doppler broadening and positron lifetime annihilation spectroscopy are utilized to help quantify the damage in materials treated with short, pulsed lasers. Using a femtosecond laser on single crystal silicon, this manuscript shows that clusters of vacancy-like defects and small voids increase systematically with laser power. Lastly, the damage induced by the laser can also reach to micrometer depths.
- Authors:
-
[1];
[3];
[3];
[3];
[3];
[3];
[4];
[5]
- Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Univ. of California, Berkeley, CA (United States)
- Helmholtz-Zentrum Dresden - Rossendorf, Bautzner Landstraße (Germany)
- Bowling Green State Univ., OH (United States)
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Publication Date:
- Research Org.:
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1868312
- Report Number(s):
- LA-UR-22-22974
Journal ID: ISSN 1047-4838
- Grant/Contract Number:
- 89233218CNA000001
- Resource Type:
- Accepted Manuscript
- Journal Name:
- JOM. Journal of the Minerals, Metals & Materials Society
- Additional Journal Information:
- Journal Volume: 73; Journal Issue: 12; Journal ID: ISSN 1047-4838
- Publisher:
- Springer
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Hosemann, Peter, Auguste, Rasheed, Lam, S., Butterling, M., Liedke, M. O., Attallah, A. G., Hirschmann, E., Wagner, A., Grigoropoulos, C. P., Selim, Farida, and Uberuaga, Blas P. Defect Characterization Using Positron Annihilation Spectroscopy on Laser-Ablated Surfaces. United States: N. p., 2021.
Web. doi:10.1007/s11837-021-04965-8.
Hosemann, Peter, Auguste, Rasheed, Lam, S., Butterling, M., Liedke, M. O., Attallah, A. G., Hirschmann, E., Wagner, A., Grigoropoulos, C. P., Selim, Farida, & Uberuaga, Blas P. Defect Characterization Using Positron Annihilation Spectroscopy on Laser-Ablated Surfaces. United States. https://doi.org/10.1007/s11837-021-04965-8
Hosemann, Peter, Auguste, Rasheed, Lam, S., Butterling, M., Liedke, M. O., Attallah, A. G., Hirschmann, E., Wagner, A., Grigoropoulos, C. P., Selim, Farida, and Uberuaga, Blas P. Thu .
"Defect Characterization Using Positron Annihilation Spectroscopy on Laser-Ablated Surfaces". United States. https://doi.org/10.1007/s11837-021-04965-8. https://www.osti.gov/servlets/purl/1868312.
@article{osti_1868312,
title = {Defect Characterization Using Positron Annihilation Spectroscopy on Laser-Ablated Surfaces},
author = {Hosemann, Peter and Auguste, Rasheed and Lam, S. and Butterling, M. and Liedke, M. O. and Attallah, A. G. and Hirschmann, E. and Wagner, A. and Grigoropoulos, C. P. and Selim, Farida and Uberuaga, Blas P.},
abstractNote = {In recent years, short, pulsed laser ablation has been gaining popularity for machining small-scale test geometries from bulk samples and for efficient serial sectioning. These laser-based techniques are being added to the toolbox in material science, which makes it necessary to understand the changes in the material that occur from the laser–material interaction. Positron annihilation spectroscopy is a unique, nondestructive technique to investigate small defects in materials difficult to investigate by other tools. In this work, Doppler broadening and positron lifetime annihilation spectroscopy are utilized to help quantify the damage in materials treated with short, pulsed lasers. Using a femtosecond laser on single crystal silicon, this manuscript shows that clusters of vacancy-like defects and small voids increase systematically with laser power. Lastly, the damage induced by the laser can also reach to micrometer depths.},
doi = {10.1007/s11837-021-04965-8},
journal = {JOM. Journal of the Minerals, Metals & Materials Society},
number = 12,
volume = 73,
place = {United States},
year = {Thu Oct 28 00:00:00 EDT 2021},
month = {Thu Oct 28 00:00:00 EDT 2021}
}
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