Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps

Journal Article · Fri Mar 25 00:00:00 UTC 2022 · Microscopy Today

DOI: https://doi.org/10.1017/s1551929522000414 · OSTI ID:1855806

Giannuzzi, Lucille A. ^[1]; Moldovan, Nicolaie ^[2]; Trindell, Jamie A. ^[3]; Sugar, Joshua Daniel ^[3]

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1. EXpressLO LLC, Lehigh Acres, FL (United States)
2. Alcorix Company, Plainfield, IL (United States)
3. Sandia National Lab. (SNL-CA), Livermore, CA (United States)

Low-Z nanocrystalline diamond (NCD) grids have been developed to reduce spurious fluorescence and avoid X-ray peak overlaps or interferences between the specimen and conventional metal grids. Here, the low-Z NCD grids are non-toxic and safe to handle, conductive, can be subjected to high-temperature heating experiments, and may be used for analytical work in lieu of metal grids. Both a half-grid geometry, which can be used for any lift-out method, or a full-grid geometry that can be used for ex situ lift-out or thin film analyses, can be fabricated and used for experiments.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• Grant/Contract Number: NA0003525
• OSTI ID: 1855806
• Report Number(s): SAND2022-2600J; 703917
• Journal Information: Microscopy Today, Journal Name: Microscopy Today Journal Issue: 2 Vol. 30; ISSN 1551-9295
• Publisher: Cambridge University PressCopyright Statement
• Country of Publication: United States
• Language: English