DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Towards automating structural discovery in scanning transmission electron microscopy *

Abstract

Abstract Scanning transmission electron microscopy is now the primary tool for exploring functional materials on the atomic level. Often, features of interest are highly localized in specific regions in the material, such as ferroelectric domain walls, extended defects, or second phase inclusions. Selecting regions to image for structural and chemical discovery via atomically resolved imaging has traditionally proceeded via human operators making semi-informed judgements on sampling locations and parameters. Recent efforts at automation for structural and physical discovery have pointed towards the use of ‘active learning’ methods that utilize Bayesian optimization with surrogate models to quickly find relevant regions of interest. Yet despite the potential importance of this direction, there is a general lack of certainty in selecting relevant control algorithms and how to balance a priori knowledge of the material system with knowledge derived during experimentation. Here we address this gap by developing the automated experiment workflows with several combinations to both illustrate the effects of these choices and demonstrate the tradeoffs associated with each in terms of accuracy, robustness, and susceptibility to hyperparameters for structural discovery. We discuss possible methods to build descriptors using the raw image data and deep learning based semantic segmentation, as well as themore » implementation of variational autoencoder based representation. Furthermore, each workflow is applied to a range of feature sizes including NiO pillars within a La:SrMnO 3 matrix, ferroelectric domains in BiFeO 3 , and topological defects in graphene. The code developed in this manuscript is open sourced and will be released at github.com/nccreang/AE_Workflows .« less

Authors:
ORCiD logo; ; ORCiD logo; ORCiD logo;
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
OSTI Identifier:
1844793
Alternate Identifier(s):
OSTI ID: 1829742; OSTI ID: 1860592
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Published Article
Journal Name:
Machine Learning: Science and Technology
Additional Journal Information:
Journal Name: Machine Learning: Science and Technology Journal Volume: 3 Journal Issue: 1; Journal ID: ISSN 2632-2153
Publisher:
IOP Publishing
Country of Publication:
United Kingdom
Language:
English
Subject:
47 OTHER INSTRUMENTATION; STEM; Bayesian optimization; automated experiments; data acquisition workflows

Citation Formats

Creange, Nicole, Dyck, Ondrej, Vasudevan, Rama K., Ziatdinov, Maxim, and Kalinin, Sergei V. Towards automating structural discovery in scanning transmission electron microscopy *. United Kingdom: N. p., 2022. Web. doi:10.1088/2632-2153/ac3844.
Creange, Nicole, Dyck, Ondrej, Vasudevan, Rama K., Ziatdinov, Maxim, & Kalinin, Sergei V. Towards automating structural discovery in scanning transmission electron microscopy *. United Kingdom. https://doi.org/10.1088/2632-2153/ac3844
Creange, Nicole, Dyck, Ondrej, Vasudevan, Rama K., Ziatdinov, Maxim, and Kalinin, Sergei V. Fri . "Towards automating structural discovery in scanning transmission electron microscopy *". United Kingdom. https://doi.org/10.1088/2632-2153/ac3844.
@article{osti_1844793,
title = {Towards automating structural discovery in scanning transmission electron microscopy *},
author = {Creange, Nicole and Dyck, Ondrej and Vasudevan, Rama K. and Ziatdinov, Maxim and Kalinin, Sergei V.},
abstractNote = {Abstract Scanning transmission electron microscopy is now the primary tool for exploring functional materials on the atomic level. Often, features of interest are highly localized in specific regions in the material, such as ferroelectric domain walls, extended defects, or second phase inclusions. Selecting regions to image for structural and chemical discovery via atomically resolved imaging has traditionally proceeded via human operators making semi-informed judgements on sampling locations and parameters. Recent efforts at automation for structural and physical discovery have pointed towards the use of ‘active learning’ methods that utilize Bayesian optimization with surrogate models to quickly find relevant regions of interest. Yet despite the potential importance of this direction, there is a general lack of certainty in selecting relevant control algorithms and how to balance a priori knowledge of the material system with knowledge derived during experimentation. Here we address this gap by developing the automated experiment workflows with several combinations to both illustrate the effects of these choices and demonstrate the tradeoffs associated with each in terms of accuracy, robustness, and susceptibility to hyperparameters for structural discovery. We discuss possible methods to build descriptors using the raw image data and deep learning based semantic segmentation, as well as the implementation of variational autoencoder based representation. Furthermore, each workflow is applied to a range of feature sizes including NiO pillars within a La:SrMnO 3 matrix, ferroelectric domains in BiFeO 3 , and topological defects in graphene. The code developed in this manuscript is open sourced and will be released at github.com/nccreang/AE_Workflows .},
doi = {10.1088/2632-2153/ac3844},
journal = {Machine Learning: Science and Technology},
number = 1,
volume = 3,
place = {United Kingdom},
year = {Fri Feb 11 00:00:00 EST 2022},
month = {Fri Feb 11 00:00:00 EST 2022}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1088/2632-2153/ac3844

Save / Share:

Works referenced in this record:

The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images
journal, October 2013


Building Structures Atom by Atom via Electron Beam Manipulation
journal, August 2018


Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python.
journal, August 2019

  • Meyer, Chris; Dellby, Niklas; Hachtel, Jordan A.
  • Microscopy and Microanalysis, Vol. 25, Issue S2
  • DOI: 10.1017/S143192761900134X

Big, Deep, and Smart Data in Scanning Probe Microscopy
journal, September 2016


Engineering single-atom dynamics with electron irradiation
journal, May 2019


Direct Observation of Atomic Dynamics and Silicon Doping at a Topological Defect in Graphene
journal, June 2014

  • Yang, Zhiqing; Yin, Lichang; Lee, Jaekwang
  • Angewandte Chemie International Edition, Vol. 53, Issue 34
  • DOI: 10.1002/anie.201403382

Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
journal, September 2017


Unusual electrical conductivity driven by localized stoichiometry modification at vertical epitaxial interfaces
journal, January 2020

  • Zhang, Wenrui; Cheng, Shaobo; Rouleau, Christopher M.
  • Materials Horizons, Vol. 7, Issue 12
  • DOI: 10.1039/D0MH01324B

Fire up the atom forge
journal, November 2016

  • Kalinin, Sergei V.; Borisevich, Albina; Jesse, Stephen
  • Nature, Vol. 539, Issue 7630
  • DOI: 10.1038/539485a

Flexible metallic nanowires with self-adaptive contacts to semiconducting transition-metal dichalcogenide monolayers
journal, April 2014


Electron-beam introduction of heteroatomic Pt–Si structures in graphene
journal, May 2020


Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry
journal, June 2009


Electron-Beam Manipulation of Silicon Dopants in Graphene
journal, June 2018


Investigating phase transitions from local crystallographic analysis based on statistical learning of atomic environments in 2D MoS 2 -ReS 2
journal, March 2021

  • Vasudevan, Rama K.; Ziatdinov, Maxim; Sharma, Vinit
  • Applied Physics Reviews, Vol. 8, Issue 1
  • DOI: 10.1063/5.0012761

Patterned probes for high precision 4D-STEM bragg measurements
journal, February 2020


Exploring physics of ferroelectric domain walls via Bayesian analysis of atomically resolved STEM data
journal, December 2020

  • Nelson, Christopher T.; Vasudevan, Rama K.; Zhang, Xiaohang
  • Nature Communications, Vol. 11, Issue 1
  • DOI: 10.1038/s41467-020-19907-2

A self-driving microscope and the Atomic Forge
journal, September 2019

  • Dyck, Ondrej; Jesse, Stephen; Kalinin, Sergei V.
  • MRS Bulletin, Vol. 44, Issue 09
  • DOI: 10.1557/mrs.2019.211

Algorithms and Software for Nanomanipulation with Atomic Force Microscopes
journal, April 2009

  • Requicha, A. A. G.; Arbuckle, D. J.; Mokaberi, B.
  • The International Journal of Robotics Research, Vol. 28, Issue 4
  • DOI: 10.1177/0278364908100926

Applying compressive sensing to TEM video: a substantial frame rate increase on any camera
journal, August 2015

  • Stevens, Andrew; Kovarik, Libor; Abellan, Patricia
  • Advanced Structural and Chemical Imaging, Vol. 1, Issue 10
  • DOI: 10.1186/s40679-015-0009-3

Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization
journal, August 2020


Disentangling nanoscale electric and magnetic fields by time-reversal operation in differential phase-contrast STEM
journal, October 2020

  • Campanini, M.; Nasi, L.; Albertini, F.
  • Applied Physics Letters, Vol. 117, Issue 15
  • DOI: 10.1063/5.0026121

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
journal, January 1996


Open source scanning probe microscopy control software package GXSM
journal, May 2010

  • Zahl, Percy; Wagner, Thorsten; Möller, Rolf
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 28, Issue 3
  • DOI: 10.1116/1.3374719

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
journal, March 2010

  • Krivanek, Ondrej L.; Chisholm, Matthew F.; Nicolosi, Valeria
  • Nature, Vol. 464, Issue 7288
  • DOI: 10.1038/nature08879

Direct Observation of Continuous Electric Dipole Rotation in Flux-Closure Domains in Ferroelectric Pb(Zr,Ti)O3
journal, March 2011


Placing single atoms in graphene with a scanning transmission electron microscope
journal, September 2017

  • Dyck, Ondrej; Kim, Songkil; Kalinin, Sergei V.
  • Applied Physics Letters, Vol. 111, Issue 11
  • DOI: 10.1063/1.4998599

Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback
journal, April 2018


Electron-Beam Shaping in the Transmission Electron Microscope: Control of Electron-Beam Propagation Along Atomic Columns
journal, April 2019


Predictability as a probe of manifest and latent physics: The case of atomic scale structural, chemical, and polarization behaviors in multiferroic Sm-doped BiFeO 3
journal, March 2021

  • Ziatdinov, Maxim; Creange, Nicole; Zhang, Xiaohang
  • Applied Physics Reviews, Vol. 8, Issue 1
  • DOI: 10.1063/5.0016792

Atomic-resolution spectroscopic imaging: past, present and future
journal, January 2009

  • Pennycook, S. J.; Varela, M.; Lupini, A. R.
  • Journal of Electron Microscopy, Vol. 58, Issue 3
  • DOI: 10.1093/jmicro/dfn030

Single atom visibility in STEM optical depth sectioning
journal, October 2016

  • Ishikawa, Ryo; Pennycook, Stephen J.; Lupini, Andrew R.
  • Applied Physics Letters, Vol. 109, Issue 16
  • DOI: 10.1063/1.4965709

Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts
journal, June 2014

  • Yankovich, Andrew B.; Berkels, Benjamin; Dahmen, W.
  • Nature Communications, Vol. 5, Issue 1
  • DOI: 10.1038/ncomms5155

N-FINDR: an algorithm for fast autonomous spectral end-member determination in hyperspectral data
conference, October 1999

  • Winter, Michael E.
  • SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, SPIE Proceedings
  • DOI: 10.1117/12.366289

AtomAI: Open-source software for applications of deep learning to microscopy data
journal, July 2021


Doping of Cr in Graphene Using Electron Beam Manipulation for Functional Defect Engineering
journal, October 2020

  • Dyck, Ondrej; Yoon, Mina; Zhang, Lizhi
  • ACS Applied Nano Materials, Vol. 3, Issue 11
  • DOI: 10.1021/acsanm.0c02118

Silicon Substitution in Nanotubes and Graphene via Intermittent Vacancies
journal, May 2019


Depth sectioning with the aberration-corrected scanning transmission electron microscope
journal, February 2006

  • Borisevich, A. Y.; Lupini, A. R.; Pennycook, S. J.
  • Proceedings of the National Academy of Sciences, Vol. 103, Issue 9
  • DOI: 10.1073/pnas.0507105103

Big data in reciprocal space: Sliding fast Fourier transforms for determining periodicity
journal, March 2015

  • Vasudevan, Rama K.; Belianinov, Alex; Gianfrancesco, Anthony G.
  • Applied Physics Letters, Vol. 106, Issue 9
  • DOI: 10.1063/1.4914016

Direct Observation of Dopant Atom Diffusion in a Bulk Semiconductor Crystal Enhanced by a Large Size Mismatch
journal, October 2014


Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018


Atomic-resolution differential phase contrast STEM on ferroelectric materials: A mean-field approach
journal, May 2020


Partial Scanning Transmission Electron Microscopy with Deep Learning
journal, May 2020


Spectroscopic Imaging of Single Atoms Within a Bulk Solid
journal, March 2004


Generation of Nondiffracting Electron Bessel Beams
journal, January 2014


Ensemble learning-iterative training machine learning for uncertainty quantification and automated experiment in atom-resolved microscopy
journal, July 2021


Dynamic scan control in STEM: spiral scans
journal, June 2016

  • Sang, Xiahan; Lupini, Andrew R.; Unocic, Raymond R.
  • Advanced Structural and Chemical Imaging, Vol. 2, Issue 1
  • DOI: 10.1186/s40679-016-0020-3

Temperature Measurement by a Nanoscale Electron Probe Using Energy Gain and Loss Spectroscopy
journal, March 2018


Artificial-intelligence-driven scanning probe microscopy
journal, March 2020