Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamics
Abstract
Scanning Transmission Electron Microscopy Diffraction Contrast Imaging (STEM-DCI) has been gaining popularity for the identification and analysis of dislocations in crystalline materials due to its ability to supress undesirable image features that are often present in conventional TEM images. However, there does not yet exist a robust body of work demonstrating expected contrast in these imaging conditions. A novel approach for the simulation of STEM-DCI images was developed using a modified form of the scattering matrix formalism. This algorithm was used to simulate a variety of dislocation configurations generated using three-dimensional discrete dislocation dynamics.
- Authors:
- Publication Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA); US Dept. of Defense (DOD) Vannevar-Bush Faculty Fellowship; National Science Foundation (NSF)
- OSTI Identifier:
- 1670217
- Alternate Identifier(s):
- OSTI ID: 1809166
- Report Number(s):
- LLNL-JRNL-812198
Journal ID: ISSN 0304-3991; S0304399120302758; 113124; PII: S0304399120302758
- Grant/Contract Number:
- AC52-07NA27344; N00014-16-1-2821; MCF-677785; CMMI-1454072
- Resource Type:
- Published Article
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Name: Ultramicroscopy Journal Volume: 219 Journal Issue: C; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; STEM-DCI; scanning transmission electron microscopy; diffraction contrast imaging; discrete dislocation dynamics; simulation; diffraction
Citation Formats
Tessmer, Joseph, Singh, Saransh, Gu, Yejun, El-Awady, Jaafar A., and Graef, Marc De. Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamics. Netherlands: N. p., 2020.
Web. doi:10.1016/j.ultramic.2020.113124.
Tessmer, Joseph, Singh, Saransh, Gu, Yejun, El-Awady, Jaafar A., & Graef, Marc De. Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamics. Netherlands. https://doi.org/10.1016/j.ultramic.2020.113124
Tessmer, Joseph, Singh, Saransh, Gu, Yejun, El-Awady, Jaafar A., and Graef, Marc De. Tue .
"Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamics". Netherlands. https://doi.org/10.1016/j.ultramic.2020.113124.
@article{osti_1670217,
title = {Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamics},
author = {Tessmer, Joseph and Singh, Saransh and Gu, Yejun and El-Awady, Jaafar A. and Graef, Marc De},
abstractNote = {Scanning Transmission Electron Microscopy Diffraction Contrast Imaging (STEM-DCI) has been gaining popularity for the identification and analysis of dislocations in crystalline materials due to its ability to supress undesirable image features that are often present in conventional TEM images. However, there does not yet exist a robust body of work demonstrating expected contrast in these imaging conditions. A novel approach for the simulation of STEM-DCI images was developed using a modified form of the scattering matrix formalism. This algorithm was used to simulate a variety of dislocation configurations generated using three-dimensional discrete dislocation dynamics.},
doi = {10.1016/j.ultramic.2020.113124},
journal = {Ultramicroscopy},
number = C,
volume = 219,
place = {Netherlands},
year = {Tue Dec 01 00:00:00 EST 2020},
month = {Tue Dec 01 00:00:00 EST 2020}
}
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