Local Strain and Polarization Mapping in Ferrielectric Materials
Abstract
CuInP2S6 (CIPS) is a van der Waals material that has attracted attention because of its unusual properties. Recently, a combination of density functional theory (DFT) calculations and piezoresponse force microscopy (PFM) showed that CIPS is a uniaxial quadruple-well ferrielectric featuring two polar phases and a total of four polarization states that can be controlled by external strain. In this study, we combine DFT and PFM to investigate the stress-dependent piezoelectric properties of CIPS, which have so far remained unexplored. The two different polarization phases are predicted to differ in their mechanical properties and the stress sensitivity of their piezoelectric constants. This knowledge is applied to the interpretation of ferroelectric domain images, which enables investigation of local strain and stress distributions. The interplay of theory and experiment produces polarization maps and layer spacings which we compare to macroscopic X-ray measurements. We found that the sample contains only the low-polarization phase and that domains of one polarization orientation are strained, whereas domains of the opposite polarization direction are fully relaxed. The described nanoscale imaging methodology is applicable to any material for which the relationship between electromechanical and mechanical characteristics is known, providing insight on structural, mechanical, and electromechanical properties down to ~10more »
- Authors:
-
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Vanderbilt Univ., Nashville, TN (United States). Dept. of Physics and Astronomy and Dept. of Electrical Engineering and Computer Science
- Air Force Research Lab. (AFRL), Wright-Patterson AFB, OH (United States). Materials and Manufacturing Directorate
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; US Air Force Office of Scientific Research (AFOSR)
- OSTI Identifier:
- 1659627
- Grant/Contract Number:
- AC05-00OR22725; FG02-09ER46554; 19RXCOR052
- Resource Type:
- Accepted Manuscript
- Journal Name:
- ACS Applied Materials and Interfaces
- Additional Journal Information:
- Journal Volume: 12; Journal Issue: 34; Journal ID: ISSN 1944-8244
- Publisher:
- American Chemical Society (ACS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; copper indium thiophosphate; layers; piezoelectric constant; piezoelectrics; piezoresponse force microscopy; polarization; stress; stress mapping; van der Waals materials; x-rays
Citation Formats
Neumayer, Sabine M., Brehm, John A., Tao, Lei, O’Hara, Andrew, Ganesh, Panchapakesan, Jesse, Stephen, Susner, Michael A., McGuire, Michael A., Pantelides, Sokrates T., Maksymovych, Petro, and Balke, Nina. Local Strain and Polarization Mapping in Ferrielectric Materials. United States: N. p., 2020.
Web. doi:10.1021/acsami.0c09246.
Neumayer, Sabine M., Brehm, John A., Tao, Lei, O’Hara, Andrew, Ganesh, Panchapakesan, Jesse, Stephen, Susner, Michael A., McGuire, Michael A., Pantelides, Sokrates T., Maksymovych, Petro, & Balke, Nina. Local Strain and Polarization Mapping in Ferrielectric Materials. United States. https://doi.org/10.1021/acsami.0c09246
Neumayer, Sabine M., Brehm, John A., Tao, Lei, O’Hara, Andrew, Ganesh, Panchapakesan, Jesse, Stephen, Susner, Michael A., McGuire, Michael A., Pantelides, Sokrates T., Maksymovych, Petro, and Balke, Nina. Wed .
"Local Strain and Polarization Mapping in Ferrielectric Materials". United States. https://doi.org/10.1021/acsami.0c09246. https://www.osti.gov/servlets/purl/1659627.
@article{osti_1659627,
title = {Local Strain and Polarization Mapping in Ferrielectric Materials},
author = {Neumayer, Sabine M. and Brehm, John A. and Tao, Lei and O’Hara, Andrew and Ganesh, Panchapakesan and Jesse, Stephen and Susner, Michael A. and McGuire, Michael A. and Pantelides, Sokrates T. and Maksymovych, Petro and Balke, Nina},
abstractNote = {CuInP2S6 (CIPS) is a van der Waals material that has attracted attention because of its unusual properties. Recently, a combination of density functional theory (DFT) calculations and piezoresponse force microscopy (PFM) showed that CIPS is a uniaxial quadruple-well ferrielectric featuring two polar phases and a total of four polarization states that can be controlled by external strain. In this study, we combine DFT and PFM to investigate the stress-dependent piezoelectric properties of CIPS, which have so far remained unexplored. The two different polarization phases are predicted to differ in their mechanical properties and the stress sensitivity of their piezoelectric constants. This knowledge is applied to the interpretation of ferroelectric domain images, which enables investigation of local strain and stress distributions. The interplay of theory and experiment produces polarization maps and layer spacings which we compare to macroscopic X-ray measurements. We found that the sample contains only the low-polarization phase and that domains of one polarization orientation are strained, whereas domains of the opposite polarization direction are fully relaxed. The described nanoscale imaging methodology is applicable to any material for which the relationship between electromechanical and mechanical characteristics is known, providing insight on structural, mechanical, and electromechanical properties down to ~10 nm length scales.},
doi = {10.1021/acsami.0c09246},
journal = {ACS Applied Materials and Interfaces},
number = 34,
volume = 12,
place = {United States},
year = {Wed Jul 29 00:00:00 EDT 2020},
month = {Wed Jul 29 00:00:00 EDT 2020}
}
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