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Title: Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials

Journal Article · · Angewandte Chemie (International Edition)

Abstract Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State‐of‐the‐art atomic resolution or in situ scanning transmission electron microscopy and electron energy‐loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single‐atom resolution, but they are not able to measure many properties that dictate function, such as vibrational modes or charge transfer, and are limited to room‐temperature samples containing no liquids. Here, we outline emerging electron microscopy techniques that are allowing these limitations to be overcome and highlight several recent studies that were enabled by these techniques. We then provide a vision for how these techniques can be paired with each other and with in situ methods to deliver new insights into the static and dynamic behavior of functional interfaces.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1651402
Alternate ID(s):
OSTI ID: 1570538
Journal Information:
Angewandte Chemie (International Edition), Vol. 59, Issue 4; ISSN 1433-7851
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English

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