Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials

Zachman, Michael; Hachtel, Jordan; Idrobo Tapia, Juan; Chi, Miaofang

doi:10.1002/anie.201902993

Title: Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials

Journal Article · 13 May 2019 · Angewandte Chemie (International Edition)

DOI: https://doi.org/10.1002/anie.201902993 · OSTI ID:1651402

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Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State-of-the-art atomic resolution or in situ scanning transmission electron microscopy and electron energy-loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single-atom resolution, but they are not able to measure many properties that dictate function, such as vibrational modes or charge transfer, and are limited to room-temperature samples containing no liquids. Here, we outline emerging electron microscopy techniques that are allowing these limitations to be overcome and highlight several recent studies that were enabled by these techniques. We then provide a vision for how these techniques can be paired with each other and with in situ methods to deliver new insights into the static and dynamic behavior of functional interfaces.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1651402

Journal Information:: Angewandte Chemie (International Edition), Journal Name: Angewandte Chemie (International Edition) Journal Issue: 4 Vol. 59; ISSN 1433-7851

Publisher:: WileyCopyright Statement

Country of Publication:: United States

Language:: English

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