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Title: Reducing Radiation Damage Using Pulsed Electron Beams in the TEM

Abstract

A rise in the development and the use of ultrashort-pulsed sources (i.e., femtosecond to picosecond) in transmission electron microscopes (TEMs) has led to numerous discoveries and paradigm tests of atomic to nanoscale structural dynamics well beyond the temporal limits of fast detectors. Vital to these advances are precise control over the electron emission process, typically via the photoelectric effect, or via temporal modulation of an initially continuous beam swept across an aperture. In addition to enabling ultrafast pump-probe experiments, fine control over the emission process allows for exploration of the effects of such pulsed beams on damage sustained by the specimen during observation. Unlike proposed diffract-before-destroy methods with electrons, these approaches would ideally be applied in the single-electron-per-packet regime, with sufficient time between the arrival of each electron at the specimen for all reversible energy-deposition events to fully recover. Indeed, some intriguing results using pulsed electron beams in TEMs have been reported here, including effects on the structure of catalyst particles and apparent prolonged exposures for polymer crystals

Authors:
 [1];  [1]
  1. Univ. of Minnesota, Minneapolis, MN (United States)
Publication Date:
Research Org.:
Univ. of Minnesota, Minneapolis, MN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1595005
Grant/Contract Number:  
SC0018204
Resource Type:
Accepted Manuscript
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 25; Journal Issue: S2; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
61 RADIATION PROTECTION AND DOSIMETRY

Citation Formats

VandenBussche, Elisah J., and Flannigan, David J. Reducing Radiation Damage Using Pulsed Electron Beams in the TEM. United States: N. p., 2019. Web. doi:10.1017/S1431927619008961.
VandenBussche, Elisah J., & Flannigan, David J. Reducing Radiation Damage Using Pulsed Electron Beams in the TEM. United States. doi:10.1017/S1431927619008961.
VandenBussche, Elisah J., and Flannigan, David J. Mon . "Reducing Radiation Damage Using Pulsed Electron Beams in the TEM". United States. doi:10.1017/S1431927619008961.
@article{osti_1595005,
title = {Reducing Radiation Damage Using Pulsed Electron Beams in the TEM},
author = {VandenBussche, Elisah J. and Flannigan, David J.},
abstractNote = {A rise in the development and the use of ultrashort-pulsed sources (i.e., femtosecond to picosecond) in transmission electron microscopes (TEMs) has led to numerous discoveries and paradigm tests of atomic to nanoscale structural dynamics well beyond the temporal limits of fast detectors. Vital to these advances are precise control over the electron emission process, typically via the photoelectric effect, or via temporal modulation of an initially continuous beam swept across an aperture. In addition to enabling ultrafast pump-probe experiments, fine control over the emission process allows for exploration of the effects of such pulsed beams on damage sustained by the specimen during observation. Unlike proposed diffract-before-destroy methods with electrons, these approaches would ideally be applied in the single-electron-per-packet regime, with sufficient time between the arrival of each electron at the specimen for all reversible energy-deposition events to fully recover. Indeed, some intriguing results using pulsed electron beams in TEMs have been reported here, including effects on the structure of catalyst particles and apparent prolonged exposures for polymer crystals},
doi = {10.1017/S1431927619008961},
journal = {Microscopy and Microanalysis},
number = S2,
volume = 25,
place = {United States},
year = {2019},
month = {8}
}

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Works referenced in this record:

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journal, March 2011

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  • Proceedings of the National Academy of Sciences, Vol. 108, Issue 15
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