Phase Intergrowth and Structural Defects in Organic Metal Halide Ruddlesden–Popper Thin Films
Abstract
Organic metal halide Ruddlesden–Popper phases combine the excellent optoelectronic properties of three-dimensional, bulk hybrid perovskites with superior material stability in ambient conditions. However, the thin film structure of these layered perovskites is still poorly understood, as phase purity is typically determined solely by specular X-ray diffraction. The thin film structure of these Ruddlesden–Popper phases was examined by increasingly local characterization techniques. It is difficult to assess the phase purity by purely bulk optical and diffraction measurements. From the comparison of grazing-incidence wide angle X-ray scattering (GIWAXS) patterns of cast films to expected scattering from single-crystal structures, significant in-plane disorder was observed. Spatially localized photoluminescence measurements show that films do not phase separate on the micrometer-scale. Selected area electron diffraction measurements show the intergrowth of different phases within the same thin film, consistent with previous observations seen in epitaxially-grown Ruddlesden–Popper complex oxides. Despite the presence of phase impurities that would typically be detrimental for device performance, fits to photothermal deflection spectroscopy measurements show relatively low Urbach energies of 33 meV for (C4H9NH3)2(CH3NH3)2Pb3I10 and 32 meV for (C4H9NH3)2(CH3NH3)3Pb4I13, indicating that the electronic properties are insensitive to the phase impurities.
- Authors:
-
- Univ. of California, Santa Barbara, CA (United States)
- Mitsubishi Chemical Corporation (Japan). Electronics Materials and New Energy Lab.; Univ. of California, Santa Barbara, CA (United States)
- Publication Date:
- Research Org.:
- Univ. of California, Santa Barbara, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
- OSTI Identifier:
- 1594808
- Grant/Contract Number:
- SC0012541; HDTRA1-15-1-0023; AC02-76SF00515; DMR-1720256; DMR-1454260
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Chemistry of Materials
- Additional Journal Information:
- Journal Volume: 30; Journal Issue: 23; Journal ID: ISSN 0897-4756
- Publisher:
- American Chemical Society (ACS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Venkatesan, Naveen R., Kennard, Rhys M., DeCrescent, Ryan A., Nakayama, Hidenori, Dahlman, Clayton J., Perry, Erin E., Schuller, Jon A., and Chabinyc, Michael L. Phase Intergrowth and Structural Defects in Organic Metal Halide Ruddlesden–Popper Thin Films. United States: N. p., 2018.
Web. doi:10.1021/acs.chemmater.8b03832.
Venkatesan, Naveen R., Kennard, Rhys M., DeCrescent, Ryan A., Nakayama, Hidenori, Dahlman, Clayton J., Perry, Erin E., Schuller, Jon A., & Chabinyc, Michael L. Phase Intergrowth and Structural Defects in Organic Metal Halide Ruddlesden–Popper Thin Films. United States. https://doi.org/10.1021/acs.chemmater.8b03832
Venkatesan, Naveen R., Kennard, Rhys M., DeCrescent, Ryan A., Nakayama, Hidenori, Dahlman, Clayton J., Perry, Erin E., Schuller, Jon A., and Chabinyc, Michael L. Tue .
"Phase Intergrowth and Structural Defects in Organic Metal Halide Ruddlesden–Popper Thin Films". United States. https://doi.org/10.1021/acs.chemmater.8b03832. https://www.osti.gov/servlets/purl/1594808.
@article{osti_1594808,
title = {Phase Intergrowth and Structural Defects in Organic Metal Halide Ruddlesden–Popper Thin Films},
author = {Venkatesan, Naveen R. and Kennard, Rhys M. and DeCrescent, Ryan A. and Nakayama, Hidenori and Dahlman, Clayton J. and Perry, Erin E. and Schuller, Jon A. and Chabinyc, Michael L.},
abstractNote = {Organic metal halide Ruddlesden–Popper phases combine the excellent optoelectronic properties of three-dimensional, bulk hybrid perovskites with superior material stability in ambient conditions. However, the thin film structure of these layered perovskites is still poorly understood, as phase purity is typically determined solely by specular X-ray diffraction. The thin film structure of these Ruddlesden–Popper phases was examined by increasingly local characterization techniques. It is difficult to assess the phase purity by purely bulk optical and diffraction measurements. From the comparison of grazing-incidence wide angle X-ray scattering (GIWAXS) patterns of cast films to expected scattering from single-crystal structures, significant in-plane disorder was observed. Spatially localized photoluminescence measurements show that films do not phase separate on the micrometer-scale. Selected area electron diffraction measurements show the intergrowth of different phases within the same thin film, consistent with previous observations seen in epitaxially-grown Ruddlesden–Popper complex oxides. Despite the presence of phase impurities that would typically be detrimental for device performance, fits to photothermal deflection spectroscopy measurements show relatively low Urbach energies of 33 meV for (C4H9NH3)2(CH3NH3)2Pb3I10 and 32 meV for (C4H9NH3)2(CH3NH3)3Pb4I13, indicating that the electronic properties are insensitive to the phase impurities.},
doi = {10.1021/acs.chemmater.8b03832},
journal = {Chemistry of Materials},
number = 23,
volume = 30,
place = {United States},
year = {Tue Nov 27 00:00:00 EST 2018},
month = {Tue Nov 27 00:00:00 EST 2018}
}
Web of Science
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