Ultrafast X-ray Diffraction Study of Melt-front Dynamics in Polycrystalline Thin Films
Abstract
Melting is a basic process of matter still not fully understood at the microscopic level. In this work, we use time-resolved X-ray diffraction to examine the ultrafast melting of polycrystalline gold thin films using an optical laser pump followed by a delayed hard Xray probe pulse. We validate the formation of an intermediate new diffraction peak, which we attribute to material trapped between the solid and melted states, that forms 50ps after laser excitation and persists beyond 500ps. The peak width grows rapidly for 50ps, then narrows distinctly at longer timescales. We attribute this to a melting band originating from the grain boundaries and propagating into the grains. Our observation of this intermediate state has implications for the use of ultrafast lasers for ablation during pulsed laser deposition.
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
- OSTI Identifier:
- 1570668
- Report Number(s):
- BNL-212187-2019-JAAM
Journal ID: ISSN 2375-2548
- Grant/Contract Number:
- SC0012704
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Science Advances
- Additional Journal Information:
- Journal Volume: 6; Journal Issue: 3; Journal ID: ISSN 2375-2548
- Publisher:
- AAAS
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Citation Formats
Assefa, Tadesse A. Ultrafast X-ray Diffraction Study of Melt-front Dynamics in Polycrystalline Thin Films. United States: N. p., 2020.
Web. doi:10.1126/sciadv.aax2445.
Assefa, Tadesse A. Ultrafast X-ray Diffraction Study of Melt-front Dynamics in Polycrystalline Thin Films. United States. https://doi.org/10.1126/sciadv.aax2445
Assefa, Tadesse A. Wed .
"Ultrafast X-ray Diffraction Study of Melt-front Dynamics in Polycrystalline Thin Films". United States. https://doi.org/10.1126/sciadv.aax2445. https://www.osti.gov/servlets/purl/1570668.
@article{osti_1570668,
title = {Ultrafast X-ray Diffraction Study of Melt-front Dynamics in Polycrystalline Thin Films},
author = {Assefa, Tadesse A.},
abstractNote = {Melting is a basic process of matter still not fully understood at the microscopic level. In this work, we use time-resolved X-ray diffraction to examine the ultrafast melting of polycrystalline gold thin films using an optical laser pump followed by a delayed hard Xray probe pulse. We validate the formation of an intermediate new diffraction peak, which we attribute to material trapped between the solid and melted states, that forms 50ps after laser excitation and persists beyond 500ps. The peak width grows rapidly for 50ps, then narrows distinctly at longer timescales. We attribute this to a melting band originating from the grain boundaries and propagating into the grains. Our observation of this intermediate state has implications for the use of ultrafast lasers for ablation during pulsed laser deposition.},
doi = {10.1126/sciadv.aax2445},
journal = {Science Advances},
number = 3,
volume = 6,
place = {United States},
year = {Wed Jan 15 00:00:00 EST 2020},
month = {Wed Jan 15 00:00:00 EST 2020}
}
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