DIY XES-development of an inexpensive, versatile, and easy to fabricate XES analyzer and sample delivery system
- Purdue Univ., West Lafayette, IN (United States)
The application of X-ray emission spectroscopy (XES) has grown substantially with the development of X-ray free-electron lasers, third and fourth generation synchrotron sources, and high-power benchtop sources. By providing the high X-ray flux required for XES, these sources broaden the availability and application of this method of probing electronic structure. As the number of sources increase, so does the demand for X-ray emission detection and sample delivery systems that are cost effective and customizable. In this work, we present a detailed fabrication protocol for von Hamos X-ray optics and give details for a 3D-printed spectrometer design. Additionally, we outline an automated, externally triggered liquid sample delivery system that can be used to repeatedly deliver nanoliter droplets onto a plastic substrate for measurement. These systems are both low cost, efficient, and easy to recreate or modify depending on the application. A low cost multiple X-ray analyzer system enables measurement of dilute samples, whereas the sample delivery limits sample loss and reproducibly replaces spent sample with fresh sample in the same position. While both systems can be used in a wide range of applications, the design addresses several challenges associated specifically with time-resolved XES (TRXES). As an example application, we show results from TRXES measurements of photosystem II, a dilute, photoactive protein.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- National Center for Research Resources; National Institute of General Medical Sciences; National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0014664
- OSTI ID:
- 1561289
- Journal Information:
- X-Ray Spectrometry, XRS, Journal Name: X-Ray Spectrometry, XRS Journal Issue: 5 Vol. 48; ISSN 0049-8246
- Publisher:
- WileyCopyright Statement
- Country of Publication:
- United States
- Language:
- ENGLISH
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