Measuring ionic mobility in mixed-ionic-electronic-conducting nano-dimensioned thin films at near ambient temperatures
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1548692
- Grant/Contract Number:
- SC0002633
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Solid State Ionics
- Additional Journal Information:
- Journal Name: Solid State Ionics Journal Volume: 319 Journal Issue: C; Journal ID: ISSN 0167-2738
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Kalaev, Dmitri, Tuller, Harry L., and Riess, Ilan. Measuring ionic mobility in mixed-ionic-electronic-conducting nano-dimensioned thin films at near ambient temperatures. Netherlands: N. p., 2018.
Web. doi:10.1016/j.ssi.2018.02.021.
Kalaev, Dmitri, Tuller, Harry L., & Riess, Ilan. Measuring ionic mobility in mixed-ionic-electronic-conducting nano-dimensioned thin films at near ambient temperatures. Netherlands. https://doi.org/10.1016/j.ssi.2018.02.021
Kalaev, Dmitri, Tuller, Harry L., and Riess, Ilan. Fri .
"Measuring ionic mobility in mixed-ionic-electronic-conducting nano-dimensioned thin films at near ambient temperatures". Netherlands. https://doi.org/10.1016/j.ssi.2018.02.021.
@article{osti_1548692,
title = {Measuring ionic mobility in mixed-ionic-electronic-conducting nano-dimensioned thin films at near ambient temperatures},
author = {Kalaev, Dmitri and Tuller, Harry L. and Riess, Ilan},
abstractNote = {},
doi = {10.1016/j.ssi.2018.02.021},
journal = {Solid State Ionics},
number = C,
volume = 319,
place = {Netherlands},
year = {Fri Jun 01 00:00:00 EDT 2018},
month = {Fri Jun 01 00:00:00 EDT 2018}
}
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https://doi.org/10.1016/j.ssi.2018.02.021
https://doi.org/10.1016/j.ssi.2018.02.021
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Cited by: 5 works
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