Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy
Abstract
Activator impurities and their distribution in the host lattice play a key role in scintillation phenomena. In this work a combination of cross-sectional noncontact atomic force microscopy, x-ray photoelectron spectroscopy, and density-functional theory were used to study the distribution of Eu2+ dopants in a NaI scintillator activated by 3% EuI2. A variety of Eu-based structures were determined in crystals subjected to different postgrowth treatments. Transparent crystals with good scintillation properties contained mainly small precipitates with a cubic crystal structure and a size below 4 nm. Upon annealing, Eu segregated toward the surface, resulting in the formation of an ordered hexagonal overlayer with a EuI2 composition and a pronounced, unidirectional moiré pattern. Crystals with poor optical transparency showed a significant degree of mosaicity and the presence of precipitates. All observed crystals contained a very low concentration of Eu dopants present as isolated point defects; most of the europium was incorporated in larger structures.
- Authors:
-
[2];
- Vienna Univ. of Technology (Austria). Inst. of Applied Physics
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Vienna Univ. of Technology (Austria). Inst. of Applied Physics; Univ. of Vienna (Austria). Faculty of Physics and Center for Computational Materials Science
- Technische Univ. Wien, Vienna (Austria). X-ray Center
- Univ. of Vienna (Austria). Faculty of Physics and Center for Computational Materials Science; Univ. degli Studi di Bologna (Italy). Dipartimento di Fisica e Astronomia
- Publication Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; Austrian Science Fund (FWF)
- OSTI Identifier:
- 1558529
- Alternate Identifier(s):
- OSTI ID: 1545459
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Physical Review Materials
- Additional Journal Information:
- Journal Volume: 3; Journal Issue: 7; Journal ID: ISSN 2475-9953
- Publisher:
- American Physical Society (APS)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 73 NUCLEAR PHYSICS AND RADIATION PHYSICS
Citation Formats
Ulreich, Manuel, Boatner, Lynn A., Sokolović, Igor, Reticcioli, Michele, Stoeger, Berthold, Poelzleitner, Flora, Franchini, Cesare, Schmid, Michael, Diebold, Ulrike, and Setvin, Martin. Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy. United States: N. p., 2019.
Web. doi:10.1103/PhysRevMaterials.3.075004.
Ulreich, Manuel, Boatner, Lynn A., Sokolović, Igor, Reticcioli, Michele, Stoeger, Berthold, Poelzleitner, Flora, Franchini, Cesare, Schmid, Michael, Diebold, Ulrike, & Setvin, Martin. Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy. United States. https://doi.org/10.1103/PhysRevMaterials.3.075004
Ulreich, Manuel, Boatner, Lynn A., Sokolović, Igor, Reticcioli, Michele, Stoeger, Berthold, Poelzleitner, Flora, Franchini, Cesare, Schmid, Michael, Diebold, Ulrike, and Setvin, Martin. Wed .
"Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy". United States. https://doi.org/10.1103/PhysRevMaterials.3.075004. https://www.osti.gov/servlets/purl/1558529.
@article{osti_1558529,
title = {Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy},
author = {Ulreich, Manuel and Boatner, Lynn A. and Sokolović, Igor and Reticcioli, Michele and Stoeger, Berthold and Poelzleitner, Flora and Franchini, Cesare and Schmid, Michael and Diebold, Ulrike and Setvin, Martin},
abstractNote = {Activator impurities and their distribution in the host lattice play a key role in scintillation phenomena. In this work a combination of cross-sectional noncontact atomic force microscopy, x-ray photoelectron spectroscopy, and density-functional theory were used to study the distribution of Eu2+ dopants in a NaI scintillator activated by 3% EuI2. A variety of Eu-based structures were determined in crystals subjected to different postgrowth treatments. Transparent crystals with good scintillation properties contained mainly small precipitates with a cubic crystal structure and a size below 4 nm. Upon annealing, Eu segregated toward the surface, resulting in the formation of an ordered hexagonal overlayer with a EuI2 composition and a pronounced, unidirectional moiré pattern. Crystals with poor optical transparency showed a significant degree of mosaicity and the presence of precipitates. All observed crystals contained a very low concentration of Eu dopants present as isolated point defects; most of the europium was incorporated in larger structures.},
doi = {10.1103/PhysRevMaterials.3.075004},
journal = {Physical Review Materials},
number = 7,
volume = 3,
place = {United States},
year = {Wed Jul 24 00:00:00 EDT 2019},
month = {Wed Jul 24 00:00:00 EDT 2019}
}
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Figures / Tables:
FIG. 1: NaI:3%EuI2 crystals. a) As-grown crystal, mounted on a customized sample holder. b) Crystal subjected to post-growth annealing and quenching. c) Crystal scintillation during XPS measurements.
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