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Title: Periodically pulsed laser-assisted tunneling may generate terahertz radiation

Authors:
 [1];  [1]; ORCiD logo [2]
  1. NewPath Research L.L.C., Salt Lake City, UT (United States)
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1505991
Alternate Identifier(s):
OSTI ID: 1680015
Report Number(s):
LA-UR-17-20587; LA-UR-16-28593
Journal ID: ISSN 2166-2746
Grant/Contract Number:  
89233218CNA000001; AC52-06NA25396
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Vacuum Science and Technology B
Additional Journal Information:
Journal Volume: 35; Journal Issue: 3; Journal ID: ISSN 2166-2746
Publisher:
American Vacuum Society/AIP
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 36 MATERIALS SCIENCE

Citation Formats

Hagmann, Mark J., Coombs, David G., and Yarotski, Dmitry Anatolievitch. Periodically pulsed laser-assisted tunneling may generate terahertz radiation. United States: N. p., 2017. Web. doi:10.1116/1.4979549.
Hagmann, Mark J., Coombs, David G., & Yarotski, Dmitry Anatolievitch. Periodically pulsed laser-assisted tunneling may generate terahertz radiation. United States. doi:https://doi.org/10.1116/1.4979549
Hagmann, Mark J., Coombs, David G., and Yarotski, Dmitry Anatolievitch. Mon . "Periodically pulsed laser-assisted tunneling may generate terahertz radiation". United States. doi:https://doi.org/10.1116/1.4979549. https://www.osti.gov/servlets/purl/1505991.
@article{osti_1505991,
title = {Periodically pulsed laser-assisted tunneling may generate terahertz radiation},
author = {Hagmann, Mark J. and Coombs, David G. and Yarotski, Dmitry Anatolievitch},
abstractNote = {},
doi = {10.1116/1.4979549},
journal = {Journal of Vacuum Science and Technology B},
number = 3,
volume = 35,
place = {United States},
year = {2017},
month = {4}
}

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Free Publicly Available Full Text
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Cited by: 2 works
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Figures / Tables:

FIG. 1 FIG. 1: Normalized PSD GkϵN , vs. ϵ for different values of N in (12).

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Works referencing / citing this record:

Scanning frequency comb microscopy—A new method in scanning probe microscopy
journal, December 2018


Simulation of sub-nm carrier profiling by scanning frequency comb microscopy
journal, May 2019

  • Hagmann, M. J.; Wiedemeier, J.
  • AIP Advances, Vol. 9, Issue 5
  • DOI: 10.1063/1.5092282

    Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.