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Title: Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB

Abstract

R&D activity on Cu photocathodes is under development at the SPARC_LAB test facility to fully characterize each stage of the photocathode “life” and to have a complete overview of the photoemission properties in high brightness photo-injectors. The nano(n)-machining process presented here consists in diamond milling, and blowing with dry nitrogen. This procedure reduces the roughness of the cathode surface and prevents surface contamination introduced by other techniques, such as polishing with diamond paste or the machining with oil. Both high roughness and surface contamination cause an increase of intrinsic emittance and consequently a reduction of the overall electron beam brightness. To quantify these effects, we have characterized the photocathode surface in terms of roughness measurement, and morphology and chemical composition analysis by means of Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), and Atomic Force Microscopy (AFM) techniques. The effects of n-machining on the electron beam quality have been also investigated through emittance measurements before and after the surface processing technique. Finally, we present preliminary emittance studies of yttrium thin film on Cu photocathodes.

Authors:
 [1];  [2];  [2];  [2];  [2];  [2];  [2];  [2];  [2];  [3];  [2];  [2];  [2];  [2];  [4];  [2];  [2];  [5];  [6];  [7] more »;  [7];  [8];  [2];  [2];  [2];  [2];  [9];  [2] « less
+ Show Author Affiliations
  1. Lab. Nazionali di Frascati, Roma (Italy)
  2. Lab. Nazionali di Frascati, Roma (Italy
  3. Univ. degli Studi di Roma Tor Vergata (Italy)
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  5. Univ. del Salento, Lecce (Italy). Dipt. di Matematica e Fisica E. De Giorgi
  6. Lab. Nazionali di Frascati, Roma (Italy); Univ. degi Studi di Chieti e Pescara, Chieti (Italy). Dipartimento di Neuroscienze, Immaging e Scienze Cliniche Via dei Vestini
  7. SBAI-Univ. di Roma “La Sapienza”, Roma (Italy)
  8. Univ. del Salento, Lecce (Italy). Dipartimento di Matematica e Fisica E. De Giorgi
  9. Elettra-Sincrotrone Trieste SCpA, Trieste (Italy)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1490679
Grant/Contract Number:  
653782; AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Volume: 909; Journal Issue: C; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Photocathode; Roughness; Emittance

Citation Formats

Scifo, J., Alesini, D., Anania, M. P., Bellaveglia, M., Bellucci, S., Biagioni, A., Bisesto, F., Cardelli, F., Chiadroni, E., Cianchi, A., Costa, G., Di Giovenale, D., Di Pirro, G., Di Raddo, R., Dowell, D. H., Ferrario, M., Giribono, A., Lorusso, A., Micciulla, F., Mostacci, A., Passeri, D., Perrone, A., Piersanti, L., Pompili, R., Shpakov, V., Stella, A., Trovò, M., and Villa, F. Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB. United States: N. p., 2018. Web. doi:10.1016/j.nima.2018.01.041.
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Scifo, J., Alesini, D., Anania, M. P., Bellaveglia, M., Bellucci, S., Biagioni, A., Bisesto, F., Cardelli, F., Chiadroni, E., Cianchi, A., Costa, G., Di Giovenale, D., Di Pirro, G., Di Raddo, R., Dowell, D. H., Ferrario, M., Giribono, A., Lorusso, A., Micciulla, F., Mostacci, A., Passeri, D., Perrone, A., Piersanti, L., Pompili, R., Shpakov, V., Stella, A., Trovò, M., & Villa, F. Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB. United States. https://doi.org/10.1016/j.nima.2018.01.041
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Scifo, J., Alesini, D., Anania, M. P., Bellaveglia, M., Bellucci, S., Biagioni, A., Bisesto, F., Cardelli, F., Chiadroni, E., Cianchi, A., Costa, G., Di Giovenale, D., Di Pirro, G., Di Raddo, R., Dowell, D. H., Ferrario, M., Giribono, A., Lorusso, A., Micciulla, F., Mostacci, A., Passeri, D., Perrone, A., Piersanti, L., Pompili, R., Shpakov, V., Stella, A., Trovò, M., and Villa, F. Wed . "Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB". United States. https://doi.org/10.1016/j.nima.2018.01.041. https://www.osti.gov/servlets/purl/1490679.
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@article{osti_1490679,
title = {Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB},
author = {Scifo, J. and Alesini, D. and Anania, M. P. and Bellaveglia, M. and Bellucci, S. and Biagioni, A. and Bisesto, F. and Cardelli, F. and Chiadroni, E. and Cianchi, A. and Costa, G. and Di Giovenale, D. and Di Pirro, G. and Di Raddo, R. and Dowell, D. H. and Ferrario, M. and Giribono, A. and Lorusso, A. and Micciulla, F. and Mostacci, A. and Passeri, D. and Perrone, A. and Piersanti, L. and Pompili, R. and Shpakov, V. and Stella, A. and Trovò, M. and Villa, F.},
abstractNote = {R&D activity on Cu photocathodes is under development at the SPARC_LAB test facility to fully characterize each stage of the photocathode “life” and to have a complete overview of the photoemission properties in high brightness photo-injectors. The nano(n)-machining process presented here consists in diamond milling, and blowing with dry nitrogen. This procedure reduces the roughness of the cathode surface and prevents surface contamination introduced by other techniques, such as polishing with diamond paste or the machining with oil. Both high roughness and surface contamination cause an increase of intrinsic emittance and consequently a reduction of the overall electron beam brightness. To quantify these effects, we have characterized the photocathode surface in terms of roughness measurement, and morphology and chemical composition analysis by means of Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), and Atomic Force Microscopy (AFM) techniques. The effects of n-machining on the electron beam quality have been also investigated through emittance measurements before and after the surface processing technique. Finally, we present preliminary emittance studies of yttrium thin film on Cu photocathodes.},
doi = {10.1016/j.nima.2018.01.041},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
number = C,
volume = 909,
place = {United States},
year = {2018},
month = {1}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1016/j.nima.2018.01.041
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Cited by: 4 works
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Figures / Tables:

Figure 1 Figure 1: Photocathode’s surface. Left: surface before n-machining. Right: surface after n-machining. The machining removed about 100 µm of surface.
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Works referenced in this record:

Quantum efficiency and thermal emittance of metal photocathodes
journal, July 2009

  • Dowell, David H.; Schmerge, John F.
  • Physical Review Special Topics - Accelerators and Beams, Vol. 12, Issue 7
  • DOI: 10.1103/PhysRevSTAB.12.074201

SPARC_LAB present and future
journal, August 2013

  • Ferrario, M.; Alesini, D.; Anania, M.
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 309
  • DOI: 10.1016/j.nimb.2013.03.049

Application of Atomic Force Microscopy as a Nanotechnology Tool in Food Science
journal, May 2007

Analytical study on emittance growth caused by roughness of a metallic photocathode
journal, May 2015

Near atomically smooth alkali antimonide photocathode thin films
journal, January 2017

  • Feng, Jun; Karkare, Siddharth; Nasiatka, James
  • Journal of Applied Physics, Vol. 121, Issue 4
  • DOI: 10.1063/1.4974363

Chromatic effects in quadrupole scan emittance measurements
journal, August 2012

  • Mostacci, A.; Bellaveglia, M.; Chiadroni, E.
  • Physical Review Special Topics - Accelerators and Beams, Vol. 15, Issue 8
  • DOI: 10.1103/PhysRevSTAB.15.082802

Photoemission studies on yttrium thin films
journal, October 2010

  • Cultrera, L.; Gatti, G.; Lorusso, A.
  • Radiation Effects and Defects in Solids, Vol. 165, Issue 6-10
  • DOI: 10.1080/10420151003729466

Detailed studies of photocathodes based on Y thin films grown by PLD technique
journal, December 2011

  • Lorusso, A.; Cultrera, L.; Fasano, V.
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 269, Issue 24
  • DOI: 10.1016/j.nimb.2011.04.065

Pulsed laser deposition of yttrium photocathode suitable for use in radio-frequency guns
journal, November 2017

The FERMI free-electron lasers
journal, April 2015

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    Overestimation of thermal emittance in solenoid scans due to coupled transverse motion
    journal, December 2018

    Overestimation of thermal emittance in solenoid scans due to coupled transverse motion
    text, January 2018

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      Figures / Tables found in this record:

      Figure 1 (p. 2)figure
      Figure 2 (p. 2)figure
      Figure 3 (p. 2)figure
      Figure 4 (p. 2)figure
      Figure 5 (p. 3)figure
      Figure 6 (p. 3)figure
      Figure 7 (p. 4)figure
      Figure 8 (p. 4)figure
      Table 1 (p. 4)table
      Table 2 (p. 4)table
      Figure 9 (p. 5)figure
      Table 3 (p. 5)table
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