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Title: Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons

Abstract

Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a smallsized laboratory for ultrafast observations and measurements.

Authors:
 [1];  [2];  [3]
  1. ShanghaiTech Univ. (China)
  2. City Univ. of Hong Kong (China)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1485441
Report Number(s):
BNL-209675-2018-JAAM
Journal ID: ISSN 0304-3991
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 194; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Wan, Weishi, Chen, Fu-Rong, and Zhu, Yimei. Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons. United States: N. p., 2018. Web. doi:10.1016/j.ultramic.2018.08.005.
Wan, Weishi, Chen, Fu-Rong, & Zhu, Yimei. Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons. United States. doi:10.1016/j.ultramic.2018.08.005.
Wan, Weishi, Chen, Fu-Rong, and Zhu, Yimei. Thu . "Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons". United States. doi:10.1016/j.ultramic.2018.08.005. https://www.osti.gov/servlets/purl/1485441.
@article{osti_1485441,
title = {Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons},
author = {Wan, Weishi and Chen, Fu-Rong and Zhu, Yimei},
abstractNote = {Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a smallsized laboratory for ultrafast observations and measurements.},
doi = {10.1016/j.ultramic.2018.08.005},
journal = {Ultramicroscopy},
number = C,
volume = 194,
place = {United States},
year = {2018},
month = {8}
}

Journal Article:
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Cited by: 4 works
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