Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS

Myhre, Kristian G.; Delashmitt, Jordan C.; Sims, Nathan J.; Van Cleve, Shelley M.; Boll, Rose A.

doi:10.1116/1.5052011

Title: Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS

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Abstract

Characterization of samarium thin films molecular plated from N,N-dimethylformamide solutions onto stainless steel substrates, with either mirrorlike or brushed finishes, was carried out using a Thermo Scientific K-Alpha x-ray photoelectron spectrometer. Survey scans of the two specimens showed the presence of samarium, carbon, and oxygen with minor amounts of sodium. High-resolution spectra were then taken of the Sm 3d, O 1s, and C 1s regions. Furthermore, the chemical compositions of the two samples were found to be very similar, with the key difference being the relative amounts of two carbon species. Spectra from the survey and narrow high-resolution scans of the Sm 3d, O 1s, and C 1s regions are reported herein.

Authors:

^[1]; Delashmitt, Jordan C. ^[2]; Sims, Nathan J. ^[1];

^[1];

^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Covenant College, Lookout Mountain, GA (United States)

Publication Date:: Tue Dec 04 00:00:00 EST 2018

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Nuclear Physics (NP)

OSTI Identifier:: 1485007

Alternate Identifier(s):: OSTI ID: 1823515

Grant/Contract Number:: AC05-00OR22725

Resource Type:: Accepted Manuscript

Journal Name:: Surface Science Spectra

Additional Journal Information:: Journal Volume: 25; Journal Issue: 2; Journal ID: ISSN 1055-5269

Publisher:: American Vacuum Society - AIP

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; samarium; thin film; electrodeposition; molecular plating

Citation Formats


                    Myhre, Kristian G., Delashmitt, Jordan C., Sims, Nathan J., Van Cleve, Shelley M., and Boll, Rose A. Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS.  United States: N. p., 2018. 
Web.  doi:10.1116/1.5052011.

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                    Myhre, Kristian G., Delashmitt, Jordan C., Sims, Nathan J., Van Cleve, Shelley M., & Boll, Rose A. Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS.  United States.  https://doi.org/10.1116/1.5052011

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                    Myhre, Kristian G., Delashmitt, Jordan C., Sims, Nathan J., Van Cleve, Shelley M., and Boll, Rose A. Tue .  
"Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS".  United States.  https://doi.org/10.1116/1.5052011.  https://www.osti.gov/servlets/purl/1485007.

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@article{osti_1485007,

  title        = {Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS},

  author       = {Myhre, Kristian G. and Delashmitt, Jordan C. and Sims, Nathan J. and Van Cleve, Shelley M. and Boll, Rose A.},

  abstractNote = {Characterization of samarium thin films molecular plated from N,N-dimethylformamide solutions onto stainless steel substrates, with either mirrorlike or brushed finishes, was carried out using a Thermo Scientific K-Alpha x-ray photoelectron spectrometer. Survey scans of the two specimens showed the presence of samarium, carbon, and oxygen with minor amounts of sodium. High-resolution spectra were then taken of the Sm 3d, O 1s, and C 1s regions. Furthermore, the chemical compositions of the two samples were found to be very similar, with the key difference being the relative amounts of two carbon species. Spectra from the survey and narrow high-resolution scans of the Sm 3d, O 1s, and C 1s regions are reported herein.},

  doi          = {10.1116/1.5052011},

  journal      = {Surface Science Spectra},

  number       = 2,

  volume       = 25,

  place        = {United States},

  year         = {Tue Dec 04 00:00:00 EST 2018},

  month        = {Tue Dec 04 00:00:00 EST 2018}

}

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