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Title: High-speed raster-scanning synchrotron serial microcrystallography with a high-precision piezo-scanner

The Frontier Microfocus Macromolecular Crystallography (FMX) beamline at the National Synchrotron Light Source II with its 1 µm beam size and photon flux of 3 × 10 12photons s −1at a photon energy of 12.66 keV has reached unprecedented dose rates for a structural biology beamline. The high dose rate presents a great advantage for serial microcrystallography in cutting measurement time from hours to minutes. To provide the instrumentation basis for such measurements at the full flux of the FMX beamline, a high-speed, high-precision goniometer based on a uniqueXYZpiezo positioner has been designed and constructed. The piezo-based goniometer is able to achieve sub-100 nm raster-scanning precision at over 10 grid-linepairs s −1frequency for fly scans of a 200 µm-wide raster. The performance of the scanner in both laboratory and serial crystallography measurements up to the maximum frame rate of 750 Hz of the Eiger 16M's 4M region-of-interest mode has been verified in this work. This unprecedented experimental speed significantly reduces serial-crystallography data collection time at synchrotrons, allowing utilization of the full brightness of the emerging synchrotron radiation facilities.
Authors:
 [1] ;  [1] ;  [2] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ; ORCiD logo [1] ;  [3] ;  [1] ; ORCiD logo [1] ; ORCiD logo [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). Photon Sciences Directorate
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). Photon Sciences Directorate; Case Western Reserve Univ., Cleveland, OH (United States). Case Center for Synchrotron Biosciences
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). Photon Sciences Directorate; Rochester Inst. of Technology, Rochester, NY (United States). School of Chemistry and Materials Science
Publication Date:
Report Number(s):
BNL-209117-2018-JAAM
Journal ID: ISSN 1600-5775; JSYRES
Grant/Contract Number:
SC0012704; P41GM111244
Type:
Published Article
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 5; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); USDOE Laboratory Directed Research and Development (LDRD) Program; National Institutes of Health (NIH)
Country of Publication:
United States
Language:
English
Subject:
59 BASIC BIOLOGICAL SCIENCES; 43 PARTICLE ACCELERATORS; macromolecular crystallography; nano-positioning; serial crystallography; raster-scanning; high-precision goniometer
OSTI Identifier:
1466078
Alternate Identifier(s):
OSTI ID: 1476286

Gao, Yuan, Xu, Weihe, Shi, Wuxian, Soares, Alexei, Jakoncic, Jean, Myers, Stuart, Martins, Bruno, Skinner, John, Liu, Qun, Bernstein, Herbert, McSweeney, Sean, Nazaretski, Evgeny, and Fuchs, Martin R. High-speed raster-scanning synchrotron serial microcrystallography with a high-precision piezo-scanner. United States: N. p., Web. doi:10.1107/S1600577518010354.
Gao, Yuan, Xu, Weihe, Shi, Wuxian, Soares, Alexei, Jakoncic, Jean, Myers, Stuart, Martins, Bruno, Skinner, John, Liu, Qun, Bernstein, Herbert, McSweeney, Sean, Nazaretski, Evgeny, & Fuchs, Martin R. High-speed raster-scanning synchrotron serial microcrystallography with a high-precision piezo-scanner. United States. doi:10.1107/S1600577518010354.
Gao, Yuan, Xu, Weihe, Shi, Wuxian, Soares, Alexei, Jakoncic, Jean, Myers, Stuart, Martins, Bruno, Skinner, John, Liu, Qun, Bernstein, Herbert, McSweeney, Sean, Nazaretski, Evgeny, and Fuchs, Martin R. 2018. "High-speed raster-scanning synchrotron serial microcrystallography with a high-precision piezo-scanner". United States. doi:10.1107/S1600577518010354.
@article{osti_1466078,
title = {High-speed raster-scanning synchrotron serial microcrystallography with a high-precision piezo-scanner},
author = {Gao, Yuan and Xu, Weihe and Shi, Wuxian and Soares, Alexei and Jakoncic, Jean and Myers, Stuart and Martins, Bruno and Skinner, John and Liu, Qun and Bernstein, Herbert and McSweeney, Sean and Nazaretski, Evgeny and Fuchs, Martin R.},
abstractNote = {The Frontier Microfocus Macromolecular Crystallography (FMX) beamline at the National Synchrotron Light Source II with its 1 µm beam size and photon flux of 3 × 1012photons s−1at a photon energy of 12.66 keV has reached unprecedented dose rates for a structural biology beamline. The high dose rate presents a great advantage for serial microcrystallography in cutting measurement time from hours to minutes. To provide the instrumentation basis for such measurements at the full flux of the FMX beamline, a high-speed, high-precision goniometer based on a uniqueXYZpiezo positioner has been designed and constructed. The piezo-based goniometer is able to achieve sub-100 nm raster-scanning precision at over 10 grid-linepairs s−1frequency for fly scans of a 200 µm-wide raster. The performance of the scanner in both laboratory and serial crystallography measurements up to the maximum frame rate of 750 Hz of the Eiger 16M's 4M region-of-interest mode has been verified in this work. This unprecedented experimental speed significantly reduces serial-crystallography data collection time at synchrotrons, allowing utilization of the full brightness of the emerging synchrotron radiation facilities.},
doi = {10.1107/S1600577518010354},
journal = {Journal of Synchrotron Radiation (Online)},
number = 5,
volume = 25,
place = {United States},
year = {2018},
month = {8}
}

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