The detection of He in tungsten following ion implantation by laser-induced breakdown spectroscopy

Shaw, Guinevere C.; Bannister, Mark E.; Biewer, Theodore M.; Martin, Madhavi Z.; Meyer, Fred W.; Wirth, Brian D.

doi:10.1016/j.apsusc.2017.08.180

Title: The detection of He in tungsten following ion implantation by laser-induced breakdown spectroscopy

Journal Article · Fri Sep 08 00:00:00 EDT 2017 · Applied Surface Science

DOI: https://doi.org/10.1016/j.apsusc.2017.08.180 · OSTI ID:1439159

Shaw, Guinevere C. ^[1];

^[2];

^[3];

^[3]; Meyer, Fred W. ^[2]; Wirth, Brian D. ^[3]

Univ. of Tennessee, Knoxville, TN (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Laser-induced breakdown spectroscopy (LIBS) results are presented that provide depth-resolved identification of He implanted in polycrystalline tungsten (PC-W) targets by a 200 keV He+ ion beam, with a surface temperature of approximately 900 °C and a peak fluence of 10²³ m^–2. He retention, and the influence of He on deuterium and tritium recycling, permeation, and retention in PC-W plasma facing components are important questions for the divertor and plasma facing components in a fusion reactor, yet are difficult to quantify. The purpose of this work is to demonstrate the ability of LIBS to identify helium in tungsten; to investigate the sensitivity of laser parameters including, laser energy and gate delay, that directly influence the sensitivity and depth resolution of LIBS; and to perform a proof-of-principle experiment using LIBS to measure relative He intensities as a function of depth. In conclusion, the results presented demonstrate the potential not only to identify helium but also to develop a methodology to quantify gaseous impurity concentration in PC-W as a function of depth.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1439159

Journal Information:: Applied Surface Science, Journal Name: Applied Surface Science Journal Issue: PB Vol. 427; ISSN 0169-4332

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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