Processing-dependent thermal stability of a prototypical amorphous metal oxide

Zeng, Li; Moghadam, Mahyar M.; Buchholz, D. Bruce; Li, Ran; Keane, Denis T.; Dravid, Vinayak P.; Chang, Robert P. H.; Voorhees, Peter W.; Marks, Tobin J.; Bedzyk, Michael J.

doi:10.1103/PhysRevMaterials.2.053401

Title: Processing-dependent thermal stability of a prototypical amorphous metal oxide

Authors:: Zeng, Li; Moghadam, Mahyar M.; Buchholz, D. Bruce; Li, Ran; Keane, Denis T.; Dravid, Vinayak P.; Chang, Robert P. H.; Voorhees, Peter W.; Marks, Tobin J.; Bedzyk, Michael J.

Publication Date:: Tue May 15 00:00:00 EDT 2018

Sponsoring Org.:: USDOE

OSTI Identifier:: 1437207

Grant/Contract Number:: AC02-06CH11357

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Physical Review Materials

Additional Journal Information:: Journal Name: Physical Review Materials Journal Volume: 2 Journal Issue: 5; Journal ID: ISSN 2475-9953

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

Citation Formats


                    Zeng, Li, Moghadam, Mahyar M., Buchholz, D. Bruce, Li, Ran, Keane, Denis T., Dravid, Vinayak P., Chang, Robert P. H., Voorhees, Peter W., Marks, Tobin J., and Bedzyk, Michael J. Processing-dependent thermal stability of a prototypical amorphous metal oxide.  United States: N. p., 2018. 
Web.  doi:10.1103/PhysRevMaterials.2.053401.

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                    Zeng, Li, Moghadam, Mahyar M., Buchholz, D. Bruce, Li, Ran, Keane, Denis T., Dravid, Vinayak P., Chang, Robert P. H., Voorhees, Peter W., Marks, Tobin J., & Bedzyk, Michael J. Processing-dependent thermal stability of a prototypical amorphous metal oxide.  United States.  https://doi.org/10.1103/PhysRevMaterials.2.053401

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                    Zeng, Li, Moghadam, Mahyar M., Buchholz, D. Bruce, Li, Ran, Keane, Denis T., Dravid, Vinayak P., Chang, Robert P. H., Voorhees, Peter W., Marks, Tobin J., and Bedzyk, Michael J. Tue .  
"Processing-dependent thermal stability of a prototypical amorphous metal oxide".  United States.  https://doi.org/10.1103/PhysRevMaterials.2.053401.

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@article{osti_1437207,

  title        = {Processing-dependent thermal stability of a prototypical amorphous metal oxide},

  author       = {Zeng, Li and Moghadam, Mahyar M. and Buchholz, D. Bruce and Li, Ran and Keane, Denis T. and Dravid, Vinayak P. and Chang, Robert P. H. and Voorhees, Peter W. and Marks, Tobin J. and Bedzyk, Michael J.},

  abstractNote = {},

  doi          = {10.1103/PhysRevMaterials.2.053401},

  journal      = {Physical Review Materials},

  number       = 5,

  volume       = 2,

  place        = {United States},

  year         = {Tue May 15 00:00:00 EDT 2018},

  month        = {Tue May 15 00:00:00 EDT 2018}

}

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https://doi.org/10.1103/PhysRevMaterials.2.053401

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Works referenced in this record:

Simulation of phase transformation kinetics in thin films under a constant nucleation rate
journal, August 2016

Moghadam, M. M.; Pang, E. L.; Philippe, T.
Thin Solid Films, Vol. 612
DOI: 10.1016/j.tsf.2016.06.035

Differences between amorphous indium oxide thin films
journal, October 2013

Buchholz, D. Bruce; Zeng, Li; Bedzyk, Michael J.
Progress in Natural Science: Materials International, Vol. 23, Issue 5
DOI: 10.1016/j.pnsc.2013.08.004

Highly Bendable In-Ga-ZnO Thin Film Transistors by Using a Thermally Stable Organic Dielectric Layer
journal, November 2016

Kumaresan, Yogeenth; Pak, Yusin; Lim, Namsoo
Scientific Reports, Vol. 6, Issue 1
DOI: 10.1038/srep37764

Oxygen “Getter” Effects on Microstructure and Carrier Transport in Low Temperature Combustion-Processed a-InXZnO (X = Ga, Sc, Y, La) Transistors
journal, July 2013

Hennek, Jonathan W.; Smith, Jeremy; Yan, Aiming
Journal of the American Chemical Society, Vol. 135, Issue 29
DOI: 10.1021/ja403586x

A study of low temperature crystallization of amorphous thin film indium–tin–oxide
journal, June 1999

Paine, David C.; Whitson, T.; Janiac, D.
Journal of Applied Physics, Vol. 85, Issue 12
DOI: 10.1063/1.370695

Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors
journal, November 2004

Nomura, Kenji; Ohta, Hiromichi; Takagi, Akihiro
Nature, Vol. 432, Issue 7016, p. 488-492
DOI: 10.1038/nature03090

Crystallization of Amorphous In ₂ O ₃ Films during Film Growth
journal, December 1991

Muranaka, Shigetoshi
Japanese Journal of Applied Physics, Vol. 30, Issue Part 2, No. 12A
DOI: 10.1143/JJAP.30.L2062

The 2016 oxide electronic materials and oxide interfaces roadmap
journal, October 2016

Lorenz, M.; Ramachandra Rao, M. S.; Venkatesan, T.
Journal of Physics D: Applied Physics, Vol. 49, Issue 43
DOI: 10.1088/0022-3727/49/43/433001

Level-set simulation of anisotropic phase transformations via faceted growth
journal, February 2018

Moghadam, M. M.; Voorhees, P. W.
Computational Materials Science, Vol. 143
DOI: 10.1016/j.commatsci.2017.10.055

Cation Size Effects on the Electronic and Structural Properties of Solution-Processed In-X-O Thin Films
journal, June 2015

Smith, Jeremy; Zeng, Li; Khanal, Rabi
Advanced Electronic Materials, Vol. 1, Issue 7
DOI: 10.1002/aelm.201500146

The Structure and Properties of Amorphous Indium Oxide
journal, September 2014

Buchholz, D. Bruce; Ma, Qing; Alducin, Diego
Chemistry of Materials, Vol. 26, Issue 18
DOI: 10.1021/cm502689x

Transparent Semiconducting Oxide Technology for Touch Free Interactive Flexible Displays
journal, April 2015

Sungsik Lee, ; Chaji, Reza
Proceedings of the IEEE, Vol. 103, Issue 4
DOI: 10.1109/JPROC.2015.2405767

Crystallization process and electro-optical properties of In2O3 and ITO thin films
journal, November 2006

Adurodija, Frederick Ojo; Semple, Lynne; Brüning, Ralf
Journal of Materials Science, Vol. 41, Issue 21
DOI: 10.1007/s10853-006-0038-3

Material characteristics and applications of transparent amorphous oxide semiconductors
journal, January 2010

Kamiya, Toshio; Hosono, Hideo
NPG Asia Materials, Vol. 2, Issue 1
DOI: 10.1038/asiamat.2010.5

An ‘aqueous route’ for the fabrication of low-temperature-processable oxide flexible transparent thin-film transistors on plastic substrates
journal, April 2013

Hwan Hwang, Young; Seo, Jin-Suk; Moon Yun, Je
NPG Asia Materials, Vol. 5, Issue 4
DOI: 10.1038/am.2013.11

Recent Advances in Understanding the Structure and Properties of Amorphous Oxide Semiconductors
journal, August 2017

Medvedeva, Julia E.; Buchholz, D. Bruce; Chang, Robert P. H.
Advanced Electronic Materials, Vol. 3, Issue 9
DOI: 10.1002/aelm.201700082

X-ray determination of crystallinity and diffuse disorder scattering
journal, November 1961

Ruland, W.
Acta Crystallographica, Vol. 14, Issue 11
DOI: 10.1107/S0365110X61003429

Metal oxides for optoelectronic applications
journal, March 2016

Yu, Xinge; Marks, Tobin J.; Facchetti, Antonio
Nature Materials, Vol. 15, Issue 4
DOI: 10.1038/nmat4599

Low-Temperature, Nontoxic Water-Induced Metal-Oxide Thin Films and Their Application in Thin-Film Transistors
journal, March 2015

Liu, Guoxia; Liu, Ao; Zhu, Huihui
Advanced Functional Materials, Vol. 25, Issue 17
DOI: 10.1002/adfm.201500056

xrayutilities : a versatile tool for reciprocal space conversion of scattering data recorded with linear and area detectors
journal, July 2013

Kriegner, Dominik; Wintersberger, Eugen; Stangl, Julian
Journal of Applied Crystallography, Vol. 46, Issue 4
DOI: 10.1107/S0021889813017214

Thermal stability of amorphous Zn-In-Sn-O films
journal, September 2014

Proffit, Diana E.; Philippe, Thomas; Emery, Jonathan D.
Journal of Electroceramics, Vol. 34, Issue 2-3
DOI: 10.1007/s10832-014-9967-4

Granulation, Phase Change, and Microstructure Kinetics of Phase Change. III
journal, February 1941

Avrami, Melvin
The Journal of Chemical Physics, Vol. 9, Issue 2, p. 177-184
DOI: 10.1063/1.1750872

Transparent Conducting Oxides: Electronic Structure-Property Relationship from Photoelectron Spectroscopy with in situ Sample Preparation
journal, December 2012

Klein, Andreas
Journal of the American Ceramic Society
DOI: 10.1111/jace.12143

Modeling interface-controlled phase transformation kinetics in thin films
journal, May 2015

Pang, E. L.; Vo, N. Q.; Philippe, T.
Journal of Applied Physics, Vol. 117, Issue 17
DOI: 10.1063/1.4919725

A Level-Set Method for the Evolution of Faceted Crystals
journal, January 2000

Russo, Giovanni; Smereka, Peter
SIAM Journal on Scientific Computing, Vol. 21, Issue 6
DOI: 10.1137/S1064827599351921

An amorphous oxide semiconductor thin-film transistor route to oxide electronics
journal, April 2014

Wager, John F.; Yeh, Bao; Hoffman, Randy L.
Current Opinion in Solid State and Materials Science, Vol. 18, Issue 2
DOI: 10.1016/j.cossms.2013.07.002

Ultra-Flexible, “Invisible” Thin-Film Transistors Enabled by Amorphous Metal Oxide/Polymer Channel Layer Blends
journal, February 2015

Yu, Xinge; Zeng, Li; Zhou, Nanjia
Advanced Materials, Vol. 27, Issue 14
DOI: 10.1002/adma.201405400

Investigation of diffusion and crystallization processes in thin ITO films by temperature and time resolved grazing incidence X-ray diffractometry
journal, August 2003

Quaas, M.; Steffen, H.; Hippler, R.
Surface Science, Vol. 540, Issue 2-3
DOI: 10.1016/S0039-6028(03)00850-1

Present status of amorphous In–Ga–Zn–O thin-film transistors
journal, February 2010

Kamiya, Toshio; Nomura, Kenji; Hosono, Hideo
Science and Technology of Advanced Materials, Vol. 11, Issue 4
DOI: 10.1088/1468-6996/11/4/044305

Low-temperature, high-performance solution-processed metal oxide thin-film transistors formed by a ‘sol–gel on chip’ process
journal, December 2010

Banger, K. K.; Yamashita, Y.; Mori, K.
Nature Materials, Vol. 10, Issue 1, p. 45-50
DOI: 10.1038/nmat2914

In Situ Crystallization and Morphological Evolution in Multicomponent Indium Oxide Thin Films
journal, January 2017

Moghadam, Mahyar M.; Li, Ran; Buchholz, D. Bruce
Crystal Growth & Design, Vol. 17, Issue 3
DOI: 10.1021/acs.cgd.6b01849

Kinetics of Phase Change. I General Theory
journal, December 1939

Avrami, Melvin
The Journal of Chemical Physics, Vol. 7, Issue 12, p. 1103-1112
DOI: 10.1063/1.1750380

Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances
journal, May 2012

Fortunato, E.; Barquinha, P.; Martins, R.
Advanced Materials, Vol. 24, Issue 22
DOI: 10.1002/adma.201103228

Thin film phase transformation kinetics: From theory to experiment
journal, November 2016

Moghadam, M. M.; Voorhees, P. W.
Scripta Materialia, Vol. 124
DOI: 10.1016/j.scriptamat.2016.07.010

Transparent Conducting Oxides
journal, August 2000

Ginley, David S.; Bright, Clark
MRS Bulletin, Vol. 25, Issue 8
DOI: 10.1557/mrs2000.256

Metal Oxide Transistors via Polyethylenimine Doping of the Channel Layer: Interplay of Doping, Microstructure, and Charge Transport
journal, June 2016

Huang, Wei; Zeng, Li; Yu, Xinge
Advanced Functional Materials, Vol. 26, Issue 34
DOI: 10.1002/adfm.201602069

Relationship between electrical properties and crystallization of indium oxide thin films using ex-situ grazing-incidence wide-angle x-ray scattering
journal, May 2017

González, G. B.; Okasinski, J. S.; Buchholz, D. B.
Journal of Applied Physics, Vol. 121, Issue 20
DOI: 10.1063/1.4984054

Fast pole figure acquisition using area detectors at the DiffAbs beamline – Synchrotron SOLEIL
journal, November 2013

Mocuta, Cristian; Richard, Marie-Ingrid; Fouet, Julie
Journal of Applied Crystallography, Vol. 46, Issue 6
DOI: 10.1107/S0021889813027453

Polarization relaxation kinetics and 180° domain wall dynamics in ferroelectric thin films
journal, November 2001

Ganpule, C. S.; Roytburd, A. L.; Nagarajan, V.
Physical Review B, Vol. 65, Issue 1
DOI: 10.1103/PhysRevB.65.014101

Composition-dependent structural and transport properties of amorphous transparent conducting oxides
journal, May 2015

Khanal, Rabi; Buchholz, D. Bruce; Chang, Robert P. H.
Physical Review B, Vol. 91, Issue 20
DOI: 10.1103/PhysRevB.91.205203

Probing the Unique Role of Gallium in Amorphous Oxide Semiconductors through Structure-Property Relationships
journal, September 2017

Moffitt, Stephanie L.; Zhu, Qimin; Ma, Qing
Advanced Electronic Materials, Vol. 3, Issue 10
DOI: 10.1002/aelm.201700189

Preparation and Crystallization of Tin-doped and Undoped Amorphous Indium Oxide Films Deposited by Sputtering
journal, September 1999

Song, Pung Keun; Akao, Hirotaka; Kamei, Masayuki
Japanese Journal of Applied Physics, Vol. 38, Issue Part 1, No. 9A
DOI: 10.1143/JJAP.38.5224

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Title: Processing-dependent thermal stability of a prototypical amorphous metal oxide

Citation Formats

Simulation of phase transformation kinetics in thin films under a constant nucleation rate journal, August 2016

Differences between amorphous indium oxide thin films journal, October 2013

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