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This content will become publicly available on May 31, 2019

Title: X-ray ptychography using randomized zone plates

We have developed a randomized grating condenser zone plate (GCZP) that provides a μm-scale probe for use in x-ray ptychography. This delivers a significantly better x-ray throughput than probes defined by pinhole apertures, while providing a clearly-defined level of phase diversity to the illumination on the sample, and helping to reduce the dynamic range of the detected signal by spreading the zero-order light over an extended area of the detector. The first use of this novel x-ray optical element has been demonstrated successfully for both amplitude and phase contrast imaging using soft x-rays on the TwinMic beamline at the Elettra synchrotron.
Authors:
 [1] ;  [2] ; ORCiD logo [3] ;  [4]
  1. Univ. College London, London (United Kingdom). London Centre for Nanotechnology; Science and Technology Facilities Council (STFC), Oxford (United Kingdom). Rutherford Appleton Lab. (RAL)
  2. Univ. College London, London (United Kingdom). London Centre for Nanotechnology; Science and Technology Facilities Council (STFC), Oxford (United Kingdom). Rutherford Appleton Lab. (RAL); Southern Univ. of Science and Technology, Shenzhen (China)
  3. Univ. College London, London (United Kingdom). London Centre for Nanotechnology; Science and Technology Facilities Council (STFC), Oxford (United Kingdom). Rutherford Appleton Lab. (RAL); Brookhaven National Lab. (BNL), Upton, NY (United States). Condensed Matter Physics and Materials Dept.
  4. Elettra - Sincrotrone Trieste S.C.p.A., Trieste (Italy)
Publication Date:
Report Number(s):
BNL-203644-2018-JAAM
Journal ID: ISSN 1094--4087
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 26; Journal Issue: 12; Journal ID: ISSN 1094--4087
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; X-ray optics; diffractive optics; coherence imaging; X-ray microscopy
OSTI Identifier:
1436451